2016
DOI: 10.1016/j.spmi.2016.08.024
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Modeling the charge density profile in thin film devices using SIMS profiling data

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Cited by 4 publications
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“…In fact, stresses accumulated during growth might even be enhanced by the conditions of post-growth treatment (heating, irradiation, external bias-voltage, moisture, etc.) in case of creation/annihilation of vacancies, partial sublimation or inter-diffusion of materials, redistribution of defects, rearrangement of interface charge, and readjustment of doping profile 136,137 that greatly affect the solar cell device performance.…”
Section: Cbd Znse On Epitaxial Cugase 2 -Basic Properties Of Cbdmentioning
confidence: 99%
“…In fact, stresses accumulated during growth might even be enhanced by the conditions of post-growth treatment (heating, irradiation, external bias-voltage, moisture, etc.) in case of creation/annihilation of vacancies, partial sublimation or inter-diffusion of materials, redistribution of defects, rearrangement of interface charge, and readjustment of doping profile 136,137 that greatly affect the solar cell device performance.…”
Section: Cbd Znse On Epitaxial Cugase 2 -Basic Properties Of Cbdmentioning
confidence: 99%