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2013
DOI: 10.1016/j.tsf.2013.01.035
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Modeling of the impact of Se-vacancies on the electrical properties of Cu(In,Ga)Se2 films and junctions

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Cited by 12 publications
(16 citation statements)
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“…We examined the following situation: A sample is rapidly cooled from room temperature to the temperature of the experiment (i.e., the initial charge state concentration corresponds to the roomtemperature equilibrium; see calculations reported in [18]) and illuminated for 1 h, after which, the illumination is terminated. Moreover, the steady state (reached after illumination for a sufficiently long time) was also analyzed.…”
Section: B Results Of Simulationsmentioning
confidence: 99%
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“…We examined the following situation: A sample is rapidly cooled from room temperature to the temperature of the experiment (i.e., the initial charge state concentration corresponds to the roomtemperature equilibrium; see calculations reported in [18]) and illuminated for 1 h, after which, the illumination is terminated. Moreover, the steady state (reached after illumination for a sufficiently long time) was also analyzed.…”
Section: B Results Of Simulationsmentioning
confidence: 99%
“…In our simulations, the same values of energetic parameters characterizing electronic transitions as in a previous report [18] were used. The parameters of the (V Se − V Cu ) complexes were E EC = 0.10 eV, E HC = 0.35 eV, E HE = 0.85 eV, and E EE = 0.80 eV (according to [17]).…”
Section: B Results Of Simulationsmentioning
confidence: 99%
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“…For hole concentration >10 15 cm -3 in RT, f A values must be smaller than 0.5-0.6 [7]. It means that the increase of hole concentration should be between ~0.8N T and 2N T .…”
Section: Modelingmentioning
confidence: 98%
“…The explanation of metastable properties of CIGS by amphoteric character of (V Se -V Cu ) complex was proposed by Lany and Zunger [4], [9]. The detailed analysis of metastable properties of this defect and its influence on electrical properties of CIGS devices can be found in [10] and [11]. In our previous paper [11], we proposed a simple method of evaluation of metastable defect and shallow acceptor densities.…”
Section: Introductionmentioning
confidence: 97%