“…The latter may be a wire array, for example, driven by voltages radiating partially correlated field components [14]. The knowledge of the ACF within planar surfaces at different distances from the source can be useful to assist source reconstruction methods [28], [29], [30], [31], far-field estimation [32], [33], as well as recently introduced phase-resolved scanning [34] and Emission Source Microscopy (ESM) methods [35]. Furthermore, the method can be used in conjunction with Huygens box method -also in its incomplete version when the radiation is suppressed through some box faces [33] -to augment the information on random field fluctuations.…”