Modeling of Negative Bias Temperature Instability (NBTI) for Gate-All-Around (GAA) Stacked Nanosheet Technology

Liu, Leitao; Fang, Jingtian; Pal, Ashish; Asenov, Plamen; Bajaj, Mohit; Deng, Bei; Lin, Xi-Wei; Mahapatra, Souvik; Kengeri, Subi; Bazizi, El Mehdi

doi:10.1109/irps48228.2024.10529471

2024 IEEE International Reliability Physics Symposium (IRPS) 2024

DOI: 10.1109/irps48228.2024.10529471

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Modeling of Negative Bias Temperature Instability (NBTI) for Gate-All-Around (GAA) Stacked Nanosheet Technology

Leitao Liu,

Jingtian Fang,

Ashish Pal

et al.

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Modeling of Negative Bias Temperature Instability (NBTI) for Gate-All-Around (GAA) Stacked Nanosheet Technology

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