2005
DOI: 10.1016/j.jmatprotec.2005.02.043
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Modeling of manufacturing processes by learning systems: The naïve Bayesian classifier versus artificial neural networks

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Cited by 29 publications
(12 citation statements)
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“…(Shi & Fu 2005, Boullé, 2006Ekbal, 2006;Wu QX et al, 2006;Jin et al, 2009;Mitov et al, 2009), and on production data (Perzyk, 2005).…”
Section: Data Reductionmentioning
confidence: 99%
“…(Shi & Fu 2005, Boullé, 2006Ekbal, 2006;Wu QX et al, 2006;Jin et al, 2009;Mitov et al, 2009), and on production data (Perzyk, 2005).…”
Section: Data Reductionmentioning
confidence: 99%
“…4. It should be added that a substantial increase in the accuracy of the models using class output variables, such as CTs and NBC, cannot be achieved by increasing the number of classes (detailed testing results can be found in reference [25]).…”
Section: Significances Of the Input Variablesmentioning
confidence: 99%
“…In the context of the diagnosis of industrial systems, bayesian networks have been already used and give convenient results compared to other classification tools like support vector machines, neural networks or k-nearest neighborhoods [16], [17], [18], [19], [20]. As the performances of the CSNBN have been previously demonstrated [17], [18], we choose this classifier in this article.…”
Section: Bayesian Network For Fault Diagnosismentioning
confidence: 99%