2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) 2016
DOI: 10.1109/apemc.2016.7522737
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Modeling electromagnetic immunity of LDO under ESD electromagnetic field coupling

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Cited by 4 publications
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“…The transient EM fields produced by the ESD generator during the discharge procedure are also important factors in the induced ESD coupling on the EUT [4,9,10,13,[20][21][22]. Experimental methods [23][24][25], full wave numerical modeling [26][27][28][29][30][31], circuit modeling [5,[32][33][34][35][36], and hybrid simulations of the EUT and ESD source [25,30] can all be used to carry out the ESD coupling study. However, it appears that modeling full wave has some constraints in computation resources and modeling accuracy based on the state of the art [12].…”
Section: Introductionmentioning
confidence: 99%
“…The transient EM fields produced by the ESD generator during the discharge procedure are also important factors in the induced ESD coupling on the EUT [4,9,10,13,[20][21][22]. Experimental methods [23][24][25], full wave numerical modeling [26][27][28][29][30][31], circuit modeling [5,[32][33][34][35][36], and hybrid simulations of the EUT and ESD source [25,30] can all be used to carry out the ESD coupling study. However, it appears that modeling full wave has some constraints in computation resources and modeling accuracy based on the state of the art [12].…”
Section: Introductionmentioning
confidence: 99%