Proceedings of the 2015 International Conference on Material Science and Applications 2014
DOI: 10.2991/icmsa-15.2015.78
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Modeling and Analysis of the Dynamic Behavior for Interacting Cracks on Circular Cavities in Piezoelectric Material

Abstract: Abstract. The present paper is exposed theoretically to the influence on the dynamic stress intensity factor (DSIF) in the piezoelectric material model with two permeable radial cracks emanating from the edges of two circular cavities, subjected to the dynamic incident anti-plane shearing wave (SH-wave). Green's functions are established based on complex variable and wave function expansion methods. Conjunction and crack-simulation techniques are used to evaluate DSIFs at the cracks' tip. The problem is reduce… Show more

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“…By pressing four lined probes on sample forming ohmic contact, constant current flows from two side-probes and voltage drop is measured by two inside-probes. Resistivity and square resistance can be calculated by theory functions [8], Although the use of magnetron sputtering makes it convenient to get high quality Cu films [9], few are known about the sputtering plasma during sputtering, such as the composition, the key radical, the electron temperature as well as how these factors influencing the quality of Cu film. Optical emission spectra (OES), as a simple, inexpensive and fairlyeasy to implement technique, was a very sensitive method of detection,applicable to a wide variety of fluorescing species [10].…”
Section: Introductionmentioning
confidence: 99%
“…By pressing four lined probes on sample forming ohmic contact, constant current flows from two side-probes and voltage drop is measured by two inside-probes. Resistivity and square resistance can be calculated by theory functions [8], Although the use of magnetron sputtering makes it convenient to get high quality Cu films [9], few are known about the sputtering plasma during sputtering, such as the composition, the key radical, the electron temperature as well as how these factors influencing the quality of Cu film. Optical emission spectra (OES), as a simple, inexpensive and fairlyeasy to implement technique, was a very sensitive method of detection,applicable to a wide variety of fluorescing species [10].…”
Section: Introductionmentioning
confidence: 99%