Modeling and Analysis of Simultaneous Switching Noise for Full Wafer Scale Chip Core

Kim, Hyunwoo; Choi, Seonguk; Park, Joonsang; Kim, Haeyeon; Son, Keeyoung; Lee, Junghyun; Yoon, Jiwon; Hong, Jonghyun; Sim, Boogyo; Kim, Keunwoo; Shin, Taein; Kim, Joungho

doi:10.1109/epeps58208.2023.10314953

2023 IEEE 32nd Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) 2023

DOI: 10.1109/epeps58208.2023.10314953

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Modeling and Analysis of Simultaneous Switching Noise for Full Wafer Scale Chip Core

Hyunwoo Kim,

Seonguk Choi,

Joonsang Park

et al.

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Modeling and Analysis of Simultaneous Switching Noise for Full Wafer Scale Chip Core

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