2004
DOI: 10.1103/physrevb.69.144120
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Model of the erbium ion exchange process in lithium niobate crystals

Abstract: A model based on the Nernst-Planck equations is discussed for the trivalent ion exchange process in lithium niobate crystals. Due to the material anisotropy and the different valence state of the exchanged species, a correction to the ion flux expression is considered to include the strain effects. The model is then used to describe the erbium ion exchange in both X- and Z-cut lithium niobate crystals. In this case, the dopant in-depth profiles measured by secondary ion mass spectrometry are well fitted by the… Show more

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Cited by 5 publications
(4 citation statements)
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“…4c), silver ionic yield in the first 200 nm (close to 160 s) could be described by an erfc profile, such as in thermal diffusion processes. 49 As can be observed, its intensity progressively decreased with the sputtering time and was subsequently followed by a plateaux. Silver presence was more confined in the outermost region, in agreement with FE-SEM results.…”
Section: Resultsmentioning
confidence: 77%
“…4c), silver ionic yield in the first 200 nm (close to 160 s) could be described by an erfc profile, such as in thermal diffusion processes. 49 As can be observed, its intensity progressively decreased with the sputtering time and was subsequently followed by a plateaux. Silver presence was more confined in the outermost region, in agreement with FE-SEM results.…”
Section: Resultsmentioning
confidence: 77%
“…The high sensitivity of the SIMS technique enabled us to observe a surface enrichment of copper. The corresponding ionic yield could be described by an erfchian profile, such as in thermal diffusion processes, in the region corresponding to the first 60 s of erosion. As can be observed, its intensity progressively decreased with the sputtering time, and was subsequently followed by a plateau in the inner specimen portion, where Cu ionic yield was constant and parallel to those pertaining to Fe and O.…”
Section: Resultsmentioning
confidence: 99%
“…The high sensitivity of the SIMS technique enabled to observe a surface enrichment of Ag and Ti in the deposit region corresponding to the first 50 nm. The corresponding ionic yields vs. depth trends could be described by erfchian profiles, 56,68 _ENREF_56 with progressively decreasing intensities at higher depths. This phenomenon could be traced back to the inherent infiltration power of the RF-sputtering technique, further enhanced by plasma bombardment.…”
Section: Ag/f:mn3o4 and Tio2/f:mn3o4 Nanocompositesmentioning
confidence: 99%