2021
DOI: 10.1007/s10854-021-05435-2
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Mn-doped (Bi0.5Na0.5) TiO3 thin film with low leakage current density and high ferroelectric performance

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Cited by 5 publications
(1 citation statement)
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“…All peaks were clearly matched with standard BNT thin film X-ray diffraction pattern. [32][33][34][35][36][37][38] It is significant to note that unlike BNT based ceramic systems [39][40][41][42][43] specially 1−xBNT-xLN ceramics, where a MPB between rhombohedral and tetragonal structure was located in the range of 0.02 ⩽ x ⩽ 0.04, 31 here all thin film compositions in studied range show rhombohedral structure. For more understanding of crystal structure, lattice parameters were calculated for all compositions using X-powder and listed in Table I.…”
Section: Resultsmentioning
confidence: 90%
“…All peaks were clearly matched with standard BNT thin film X-ray diffraction pattern. [32][33][34][35][36][37][38] It is significant to note that unlike BNT based ceramic systems [39][40][41][42][43] specially 1−xBNT-xLN ceramics, where a MPB between rhombohedral and tetragonal structure was located in the range of 0.02 ⩽ x ⩽ 0.04, 31 here all thin film compositions in studied range show rhombohedral structure. For more understanding of crystal structure, lattice parameters were calculated for all compositions using X-powder and listed in Table I.…”
Section: Resultsmentioning
confidence: 90%