2015
DOI: 10.1103/physrevb.92.245405
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C60-induced Devil's Staircase transformation on a Pb/Si(111) wetting layer

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Cited by 4 publications
(3 citation statements)
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References 49 publications
(44 reference statements)
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“…In order to investigate what effect nanoscale cracks would have on the resistance of a film, we performed a numerical simulation using a percolation model [42][43][44] that allows for cracks to form. The model presented models the resistance characteristics of a resistor network in a purely classical framework.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…In order to investigate what effect nanoscale cracks would have on the resistance of a film, we performed a numerical simulation using a percolation model [42][43][44] that allows for cracks to form. The model presented models the resistance characteristics of a resistor network in a purely classical framework.…”
Section: Resultsmentioning
confidence: 99%
“…Memory limitations prevented us from scaling the simulation further. However, this is more than sufficient to see smoothing in the R versus T as in macroscopic samples, rather than the avalanche behavior seen in micron scale devices [44][45][46][47]. We model the VO 2 film as a 2D square lattice, with each lattice site representing a single homogenous grain (roughly 75 × 75 nm 2 based on atomic force microscopy measurements of the samples, not shown).…”
Section: Resultsmentioning
confidence: 99%
“…Usually, the relative composition of A and B phases (or area fraction in 2D system) is selected as the order parameter to characterize the domain patterns. Although the spontaneous formation of organized structures is a well studied subject, new phenomena are still being uncovered. …”
Section: Introductionmentioning
confidence: 99%