K-Shell-Fluorescence Yield for Carbon and Other Light Elements

Abstract

ained numerically by Takeo" appear to belong to a very general type of effect, namely, the interference resulting from the existence of several paths, in this case two, connecting initial and final states.This "two path interference, " the archetype of which is met in the diffraction of particles (or waves) through two slits, is also responsible for the nodal structure of the wave function, as seen in Sec. II, and for interference fringes in the differential scattering cross section. What is perhaps particular to the case of the spectrum is that the different paths are distinguished by a temporal parameter rather than by a spatial one as is more common, and one might speak of a "two slits in time" interference effect, as is suggested by the pictorial representation of Fig. 2. ACKNOWLEDGMENTS

Modified binary encounter Bethe model for electron-impact ionization

“…• Carbon: The relativistic and nonrelativistic cross sections are almost identical for T < 1 keV. The present MRBEB cross section, the DWBA and the XCTVS results are in good agreement with the experimental data by Egerton et al [19], Tawara et al [68], and Isaacson et al [33] (with the reduced χ 2 , Q, equal to 0.91, 0.65 and 0.73, respectively), while the experimental data by Hink et al [25] display an increasing trend toward lower T not seen in any other theory or experiment.…”

Experimental determination of cross sections forK-shell ionization by electron impact for C, O, Al, Si, and Ti

“…5), except for the theoretical curve based on PWBA from Barlett and Stelbovics [23] that is far below. On the other hand, the experimental data from Hink and Paschke [22] show a severe overestimation at energies lower than 7 keV.…”

“…[21]; solid triangles: Ref. [22]; black thin solid line: Ref. [4]; light gray thick solid line: Ref.…”

“…The experimental data sets were taken from Hink and Paschke [22] for carbon, Tawara et al [21] for carbon and oxygen, Glupe and Mehlhorn [20] for oxygen, Hink and Ziegler [15] for aluminum, Platten et al [17] for silicon and oxygen, Shchagin et al [16] for silicon, Jessenberger and Hink [18], and He et al [19] for titanium. These results can be found in the compilation of the experimental data performed by Liu et al [12], up to December, 1999.…”

“…Thickness and density of the films were characterized by x-ray reflectivity (XRR). The results were compared with experimental data from other authors [11,[15][16][17][18][19][20][21][22] and with theoretical and semiempirical curves available in the literature [4,9,10,[23][24][25][26][27][28].…”