<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:msup><mml:mi>E</mml:mi><mml:mn>2</mml:mn></mml:msup></mml:math>phase transition: Thin-film breakdown and Schottky-barrier suppression

Karpov, V. G.; Shvydka, Diana; Roussillon, Y.

doi:10.1103/physrevb.70.155332

Cited by 9 publications

(5 citation statements)

References 21 publications

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“…CF can be either stable, as in phase change memory and dielectric oxides after hard breakdown, or unstable (disappearing after the bias is removed), as in threshold switches [1]. From a practical perspective, CF can cause detrimental shunting and loss of functionality in devices such as thin-film photovoltaics and thin oxides of electronic devices [2,3]. On the other hand, in implementations such as threshold switches [4,5], phase change memory [6], and resistive memory [7], CF facilitate information storage and logic operations.…”

mentioning

confidence: 99%

Thermodynamics of second phase conductive filaments

Karpov

Nardone

Simon

2011

Journal of Applied Physics

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We present a theory of second phase conductive filaments in phase transformable systems; applications include threshold switches, phase change memory, and shunting in thin film structures. We show that the average filament parameters can be described thermodynamically. In agreement with the published data, the predicted filament current voltage characteristics exhibit negative differential resistance vanishing at high currents where the current density becomes a bulk material property. Our description is extendible to filament transients and allows for efficient numerical simulation

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mentioning

confidence: 99%

Thermodynamics of second phase conductive filaments

Karpov

Nardone

Simon

2011

Journal of Applied Physics

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“…Such large negative voltages across the shaded cells can lead to junction electric fields on the order of 10 5 V/cm and related breakdown effects (Karpov et al, 2004b). The IV curve for this scenario is shown in Fig.…”

Section: Resultsmentioning

confidence: 99%

Shading-induced failure in thin-film photovoltaic modules: Electrothermal simulation with nonuniformities

2016

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Finite element electrothermal modeling is employed to study shading-induced failure in monolithically integrated thin-film photovoltaic modules. A key element is spatial nonuniformity in current-voltage characteristics, which causes inhomogeneous current flow when part of a module is under reverse bias due to shading. Time-dependent calculations show that spots with lower reverse breakdown voltage experience greater current density and localized thermal runaway that can cause permanent damage, resulting in ohmic shunts. Such failure events lead to performance loss, especially when the module is in normal operating conditions and shunted currents lead to abnormally high module temperatures. Our simulations of temperature distributions, current-voltage characteristics, and electroluminescence are compared to data from the literature for copper indium gallium diselenide devices.

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“…After finding the specified coefficients that provide the best approximation, the initial PEC parameters are determined: J sc (current density short circuit), V oc (open circuit voltage), FF (filling factor), P m (maximum power), Efficiency (coefficient of performance). LDC (light diode characteristics) R s (series resistance), R sh (shunt resistance), A (diode ideality coefficient) and J 0 (saturation diode current density) are calculated according to the found coefficients A 0 , A 1 , A 2 , A 3 , A 4 , using the relations (3)-(7) [16][17][18]. The error in determining the initial parameters and LDC is determined not only by the value of the standard deviation, but also by the error in the measurement of the light CVC.…”

Section: Methods Of Measurement and Analytical Processing Of Light Cumentioning

confidence: 99%

Investigation of Photoelectric Converters With a Base Cadmium Telluride Layer With a Decrease in Its Thickness for Tandem and Two-Sided Sensitive Instrument Structures

Deyneko

Kryvulkin

Matiushenko

et al. 2019

EUREKA: Physics and Engineering

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Photovoltaic cells with a base layer of cadmium telluride with a decrease in its thickness are studied. It is known that the widespread use of photovoltaic converters is constrained by their high price in the case of highly efficient instrument structures, or low efficiency. The creation of tandem and two-sided sensitive photoelectric converters will reduce their cost while increasing their efficiency. However, to create tandem and two-sided sensitive photoelectric converters, the necessary conditions are the use of transparent contacts and a decrease in the thickness of the base layer for efficient absorption of incident radiation by the converter, which is lower. In the research process, it was found that reducing the thickness of the base layer to 1 μm allows to increase the efficiency of the photoelectric transducer during irradiation from the back. An increase in the efficiency of the photoelectric converter occurs due to a decrease in the distance from the generation region of nonequilibrium charge carriers in the region of separation. If the thickness of the base layer is less than 1 μm, then regardless of which side of the irradiation is carried out, a decrease in the efficiency of the instrument structure is observed. Increase in the efficiency of photoconverters is associated with an increase in the negative influence of recombination processes on the back contact, a decrease in the number of charge carriers generated due to incomplete absorption of incident radiation, and a decrease in the volume of the built-in field of the separating barrier when it overlaps with the depletion region of the back contact. ITO/CdS/CdTe/Cu/ITO SCs with a base layer thickness of 1 μm demonstrates degradation stability. The highest value of efficiency in the case of illumination from the front side 8.1 % and with illumination from the back side 3.8 % received after a year of operation of the photovoltaic converter.

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E2phase transition: Thin-film breakdown and Schottky-barrier suppression

Cited by 9 publications

References 21 publications

Thermodynamics of second phase conductive filaments

Thermodynamics of second phase conductive filaments

Shading-induced failure in thin-film photovoltaic modules: Electrothermal simulation with nonuniformities

Investigation of Photoelectric Converters With a Base Cadmium Telluride Layer With a Decrease in Its Thickness for Tandem and Two-Sided Sensitive Instrument Structures

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