1980
DOI: 10.1088/0022-3727/13/7/011
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Mirror electron microscopy applied to the continuous local measurement of work-function variations

Abstract: In surface studies, the mirror electron microscope (MEM) can give a picture of electrical and geometrical roughness and simultaneously a continuous measurement of local work-function changes Delta phi ; however, no critical study has been done on the accuracy of such a measurement. Using the MEM, the authors developed a new method to obtain the total electron reflection coefficient R in the very low energy range which allows them to determine accuracy and exhibit some correlations between Delta phi measurement… Show more

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Cited by 21 publications
(13 citation statements)
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References 9 publications
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“…4). In order to confirm these results, we determined Φ values using a different procedure, 14,15 and obtained consistent results. An important factor that affects the work function of bilayer graphene is the in-plane orientation of the two layers, which we next discuss from the perspective of electronic structure calculations.…”
Section: Work Function Of Graphene Bilayers On Pdmentioning
confidence: 62%
“…4). In order to confirm these results, we determined Φ values using a different procedure, 14,15 and obtained consistent results. An important factor that affects the work function of bilayer graphene is the in-plane orientation of the two layers, which we next discuss from the perspective of electronic structure calculations.…”
Section: Work Function Of Graphene Bilayers On Pdmentioning
confidence: 62%
“…5(a), three normalized bright field IV-LEEM spectra taken from bare Ir and the two hBN island types are shown. By looking at the drop in electron reflectivity when increasing the electron energy, it is obvious that the examined areas have different work functions (WFs) [55]. We estimate the difference in the WF between Ir and triangular hBN island to be 0.98 eV, while it is larger for the trapezoidal island and amounts to 1.08 eV.…”
Section: Work Function and Interaction With Iridiummentioning
confidence: 90%
“…A series of images were recorded at room temperature to determine the mirror electron microscopy (MEM) mode/LEEM mode transition [14], [15]. The sample is biased to a negative potential close to that of the LEEM electron gun (-20 kV).…”
Section: Quantitative Differences In Their Work Functions-mem/leem Trmentioning
confidence: 99%