Mirror Electron Microscopy

Godehardt, R.

doi:10.1016/s1076-5670(08)70144-7

Cited by 11 publications

(8 citation statements)

References 65 publications

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“…1 were improved by the presence of potassium, and as expected, an overall lowering of the work function also occurred. Note that the changes in local work function can be calibrated and measured by mirror electron microscopy (MEM) [41][42][43] via changes in the electron reflectivity [44][45][46].…”

Section: Leem On Si-supported Exfoliated Mosmentioning

confidence: 99%

Probing substrate-dependent long-range surface structure of single-layer and multilayerMoS2by low-energy electron microscopy and microprobe diffraction

et al. 2014

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The long-range surface structure of the dichalcogenide MoS 2 is probed with nanometer-length spatial resolution using low-energy electron microscopy (LEEM) and microprobe low-energy electron diffraction (μ-LEED). The quality of two differently prepared types of MoS 2 , single-layer and multilayer exfoliated crystals, as well as single-layer chemical-vapor-deposition (CVD)-grown crystals, is examined. The effects induced by a supporting interface are examined by utilizing two different substrates, SiO 2 and native-oxide-covered Si. In addition, the role of impurities is also studied by way of in situ deposition of the alkali-metal potassium. Microprobe measurements reveal that, unlike exfoliated MoS 2 , CVD-grown MoS 2 may, in some instances, exhibit large-scale grain-boundary alterations due to the presence of surface strain during growth. However, real-space probing by LEEM in conjunction with k-space probing by μ-LEED shows that the quality of CVD-grown MoS 2 can be comparable to that of exfoliated MoS 2 .

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Section: Leem On Si-supported Exfoliated Mosmentioning

confidence: 99%

Probing substrate-dependent long-range surface structure of single-layer and multilayerMoS2by low-energy electron microscopy and microprobe diffraction

et al. 2014

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“…An electrostatic MEM immersion lens is shown schematically in figure 1, which illustrates the divergent MEM illumination geometry considered by Kennedy et al (2010), Luk'yanov et al (1974), Dyukov et al (1991), Godehardt (1995), Nepijko & Sedov (1997), Nepijko et al (2001aNepijko et al ( ,b, 2003Nepijko et al ( , 2007 and Nepijko & Schönhense (2010). Here, an electron beam of energy U travels parallel to the optical axis z of the immersion lens and passes through the grounded anode aperture A.…”

Section: Comparison Of Divergent and Parallel Mirror Electron Microscmentioning

confidence: 99%

Addendum. Laplacian image contrast in mirror electron microscopy

et al. 2011

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We extend the theory of Laplacian image contrast in mirror electron microscopy (MEM) to the case where the sample is illuminated by a parallel, collimated beam. This popular imaging geometry corresponds to a modern low energy electron microscope equipped with a magnetic objective lens. We show that within the constraints of the relevant approximations; the results for parallel illumination differ only negligibly from diverging MEM specimen illumination conditions.

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“…This has stimulated signi¯cant e®orts to interpret MEM image contrast and extract quantitative information regarding the surface properties. 1,2,6,8,[13][14][15][16][17][18][19][20][21][22][23][24] In general, MEM image contrast can be highly non-intuitive since it arises from electric¯eld variations above the specimen. In the special case of weak electron de°ections, it can be shown that the image contrast results from the Laplacian of small height or potential variations across a sample surface, where the contrast is blurred slightly to account for the interaction of the electrons with the electrical potential away from the surface.…”

Section: Introductionmentioning

confidence: 99%

Simulation of Mirror Electron Microscopy Caustic Images in Three-Dimensions

2018

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A full, three-dimensional (3D) ray tracing approach is developed to simulate the caustics visible in mirror electron microscopy (MEM). The method reproduces MEM image contrast resulting from 3D surface relief. To illustrate the potential of the simulation methods, we study the evolution of crater contrast associated with a movie of GaAs structures generated by the droplet epitaxy technique. Specifically, we simulate the image contrast resulting from both a precursor stage and the final crater morphology which is consistent with an inverted pyramid consisting of (111) facet walls. The method therefore facilities the study of how self-assembled quantum structures evolve with time and, in particular, the development of anisotropic features including faceting.

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Mirror Electron Microscopy

Cited by 11 publications

References 65 publications

Probing substrate-dependent long-range surface structure of single-layer and multilayerMoS2by low-energy electron microscopy and microprobe diffraction

Probing substrate-dependent long-range surface structure of single-layer and multilayerMoS2by low-energy electron microscopy and microprobe diffraction

Addendum. Laplacian image contrast in mirror electron microscopy

Simulation of Mirror Electron Microscopy Caustic Images in Three-Dimensions

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