1991
DOI: 10.1063/1.348573
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Minority-carrier lifetime in AlxGa1−xAs grown by molecular-beam epitaxy

Abstract: AlxGa1−xAs (x>0.30) double heterostructures are grown by molecular-beam epitaxy (MBE) and the minority-carrier lifetimes are measured by time-resolved photoluminescence. The data indicate that the minority-carrier lifetimes in high aluminum (x>0.30) AlxGa1−xAs grown by MBE are comparable to the previously published lifetimes of material grown by liquid-phase epitaxy. The lifetimes in MBE materials appear to be somewhat larger than those measured in materials grown by metalorganic chemical vapor d… Show more

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Cited by 18 publications
(4 citation statements)
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“…Meaning X aluminium mole fraction D diffusivity [10] L diffusion length [10], [14], [15] E effective electric field [5], [6], [8] = ∇xEg S surface recombination velocity [9] E f…”
Section: Parametermentioning
confidence: 99%
“…Meaning X aluminium mole fraction D diffusivity [10] L diffusion length [10], [14], [15] E effective electric field [5], [6], [8] = ∇xEg S surface recombination velocity [9] E f…”
Section: Parametermentioning
confidence: 99%
“…Ahrenkiel et al measured electron lifetime of 13.6ns (uncorrected for interface recombinations) in 1.79eV AlGaAs with a hole concentration of 5×10 16 cm −3 . Takahashi et al used 1.87eV AlGaAs as an active junction in a solar cell and obtained good performances.…”
Section: Materials Considerationsmentioning
confidence: 99%
“…Minority carrier lifetimes in GaAs/Al x Ga 1−x As have been measured for a range of aluminium compositions. The most common methods are time resolved photo-luminescence (TRPL) (Ahrenkiel [41]) and zero-field time-of-flight (ZFTOF) (Zarem [42]) techniques.…”
Section: Minority Carrier Lifetimementioning
confidence: 99%