Minimum Average Fraction Inspected for Combined Continuous Lot by Lot Acceptance Sampling Plan

Abstract

This article investigates the problem of minimizing the average fraction inspected (AFI) for a combined continuous lot by lot acceptance sampling plan. A solution procedure is developed to find sub-optimal sampling plan parameters that will meet the average outgoing quality limit (AOQL) requirement, while guaranteeing a small AFI when the process average (>AOQL) is known.

Economic Design of a Combined Continuous Lot by Lot Acceptance Sampling Plan under the Quality Investment

“…The model is as follows: , we obtain the same AOQ function for the combined continuous lot by lot acceptance sampling plan and CSP-1 plan. Chen [9] pointed out that because of the discrete character of the acceptance and sample size and hence of a P , it is generally not possible to find ) , ( n c being a solution of pf -P a = 1 . Hence, one can search for the minimum sample size for which pf P a − = 1 is met.…”

Reducing test costs in electronics mass-production

“…The main parameters of CSPs (AOQL, i, and f) are interdependent, and can be defined by using diagrams, tables, or equations (e.g. Chen, C-H. 2004;Montgomery, 2004;Dodge, 1943;Juran, 1988;Stephens, 2001;MIL-STD-1235C, 1974Groomer and Murthy, 2003). Several combinations of i and f can result in the same AOQL.…”