Millimeter-wave deembedding using the extended TRL (ETRL) approach

Herman, Martin I.; Pao, C.K.; Lan, G.L.; Chen, J.C.

doi:10.1109/mwsym.1990.99756

Cited by 6 publications

(2 citation statements)

References 1 publication

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“…In Figure 5, the prototyped sensor is illustrated. Measured S 11 parameters are taken by Vector Network Analyzer (VNA), with TRL calibration [16] applied, the errors and effects during the de‐embedding process can be removed.…”

Section: Implementations and Discussionmentioning

confidence: 99%

Microwave angular displacement sensor with wideband matching and impedance transforming

Zhu

Cheong

Tam

et al. 2023

Electronics Letters

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This work proposes a microwave angular displacement sensor with wideband matching based on a wideband impedance transformer. According to the design requirement of the microstrip impedance transformer (load‐to‐source impedance of 250‐to‐50 Ω, centre frequency of 2.40 GHz) with Chebyshev frequency response, the proposed angular displacement sensor is explored for the high bandwidth sensitivity of 11.18 MHz/degree.

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Section: Implementations and Discussionmentioning

confidence: 99%

Microwave angular displacement sensor with wideband matching and impedance transforming

Zhu

Cheong

Tam

et al. 2023

Electronics Letters

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show abstract

“…Recently, TRL (thru, reflect, line) and TRM (thru, reflect, match) have become very popular [2][3][4][5][6][7] at very high frequency.…”

Section: Introductionmentioning

confidence: 99%

A two‐step calibration technique for measuring S‐parameters of transitional structures

Shen

Law

2003

Micro & Optical Tech Letters

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A new two‐step calibration technique to directly measure the scattering parameters of asymmetrical transitional structures is proposed in this article. This technique conducts two calibrations, each one of them for one type of the transition's two ports, and two error boxes associated with the transition measurement system can then be obtained, with which the transition's raw measured data can be corrected. Experimental studies have verified the validity of the formulation and the accuracy of the two‐step calibration technique. The technique can be extensively used to measure the scattering parameters of transitional structures without resorting to constructing back‐to‐back test fixtures. © 2003 Wiley Periodicals, Inc. Microwave Opt Technol Lett 37: 132–135, 2003; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10846

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A comparison of planar doped barrier diode performance versus Schottky diode performance in a single balanced, MIC mixer with low LO drive

Poelker

Robertson

1995

IEEE Trans. Microwave Theory Techn.

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Millimeter-wave deembedding using the extended TRL (ETRL) approach

Cited by 6 publications

References 1 publication

Microwave angular displacement sensor with wideband matching and impedance transforming

Microwave angular displacement sensor with wideband matching and impedance transforming

A two‐step calibration technique for measuring S‐parameters of transitional structures

A comparison of planar doped barrier diode performance versus Schottky diode performance in a single balanced, MIC mixer with low LO drive

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