Mid-infrared Imaging Using Strain-Relaxed Ge1–xSnx Alloys Grown on 20 nm Ge Nanowires
Lu Luo,
Mahmoud R. M. Atalla,
Simone Assali
et al.
Abstract:Germanium−tin (Ge 1−x Sn x ) semiconductors are a front-runner platform for compact mid-infrared devices due to their tunable narrow bandgap and compatibility with silicon processing. However, their large lattice parameter has been a major hurdle, limiting the quality of epitaxial layers grown on silicon or germanium substrates. Herein, we demonstrate that 20 nm Ge nanowires (NWs) act as effective compliant substrates to grow extended defect-free Ge 1−x Sn x alloys with a composition uniformity over several mi… Show more
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