2009
DOI: 10.1063/1.3253703
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Microwave transmissivity of a metamaterial–dielectric stack

Abstract: A metamaterial layer comprising of a conducting square mesh surrounding subwavelength holes has a largely pure imaginary effective refractive index. We explore the microwave transmissivity of a stack of such metamaterial layers separated by dielectric spacers. As expected, a family of high transmissivity bands is experimentally observed. It is found that the lowest frequency edge is independent of the number of unit cells making up the structure and is highly tunable by appropriate geometrical design of the me… Show more

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Cited by 14 publications
(22 citation statements)
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“…4(b) is compared with the spectra reported in Ref. 25 for the stacked grids, we can see that, in contrast with the bandpass behavior of the grid structure, the patch structure exhibits a low-pass band followed by a wide stopband (followed by another passband, and so on). This behavior is observed independently of the number of stacked layers.…”
Section: B Validation Of the Circuit Modelmentioning
confidence: 70%
See 3 more Smart Citations
“…4(b) is compared with the spectra reported in Ref. 25 for the stacked grids, we can see that, in contrast with the bandpass behavior of the grid structure, the patch structure exhibits a low-pass band followed by a wide stopband (followed by another passband, and so on). This behavior is observed independently of the number of stacked layers.…”
Section: B Validation Of the Circuit Modelmentioning
confidence: 70%
“…At this point, it is worth mentioning that, in the same manner that the dense metal grid structures studied in Ref. 25 mimic the behavior of stacked dielectric slabs separated by negative-permittivity solid thin films (metals at optical frequencies have a negative real part of the permittivity), the response of the structure studied in this paper resembles the response of a system of dielectric slabs separated by thin dielectric foils of very high permittivity. In the structures with thin dielectric or metal films separating dielectric slabs, no evanescent TE/TM fields are excited.…”
Section: B Validation Of the Circuit Modelmentioning
confidence: 72%
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“…As with other experiments [27,28], modeling can also be used to visualize the electric field distribution in each mode. Plots of the norm of the electric field as a function of the distance through the sample are displayed in Fig.…”
Section: Photonic Analogmentioning
confidence: 99%