1997
DOI: 10.1016/s0921-4534(97)00022-1
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Microwave surface resistance peak at Tc in Bi2Sr2CaCu2O8 + x film

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Cited by 9 publications
(13 citation statements)
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“…4(d) [34]. We would like also to emphasize that in our case the anomalous giant resistance peak is observed in a 3D system and this makes our experimental findings and the proposed empirical modeling qualitatively different from the well-studied cases with the 1D [5,6,12,14,15] and/or 2D [2][3][4][7][8][9][10][11]13,16] systems.…”
contrasting
confidence: 67%
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“…4(d) [34]. We would like also to emphasize that in our case the anomalous giant resistance peak is observed in a 3D system and this makes our experimental findings and the proposed empirical modeling qualitatively different from the well-studied cases with the 1D [5,6,12,14,15] and/or 2D [2][3][4][7][8][9][10][11]13,16] systems.…”
contrasting
confidence: 67%
“…Later on, in thin films [2][3][4] and 1D whiskers and wires [5,6], similar effects were also found, with a considerably higher amplitude of the RðTÞ anomaly: 16% and 160%. With the discovery of quasi-2D cuprates, the RðTÞ peak around T c was also reported for these lowdimensional materials, such as NdCeCuO [7], BiSrCaCuO [8,9], and LaSrCuO [10,11], with the peak amplitude reaching 400%-700%. In 2D and 1D microstructures [6,[12][13][14][15][16], made from conventional superconducting materials (mostly Al), a narrow resistance peak close to T c was also observed, with the peak amplitude reaching the 400% level.…”
mentioning
confidence: 83%
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“…The small thickness of our samples allows the use of the thin film approximation in which Z ef f = ρ/d, where ρ is the complex resistivity of the superconductor. We did not observe, in the [T , H, ν] region here explored, resonances such as the well known substrate resonances occurring in thin films [12]. The actually measured reflection coefficient Γ m (ν), determined by the VNA at its input, include the sample response Γ(ν) as well as the interposed coaxial line response.…”
Section: Resultsmentioning
confidence: 77%
“…Measurements of the field and/or temperature induced changes of the quality factor Q and resonance frequency f 0 yielded changes in the effective surface impedance through the well known expression ∆Z ef f s (H, T ) = G∆ 1 Q(H,T ) − 2if 0 (H, T ) , where G is an appropriate geometrical factor 3 Noticeable exceptions are dielectrics with strong temperature dependent permittivity [110,114,115,116] or with an accidentally unfavorable combination of thickness, permittivity and operating frequency [117]. 4 We note that demagnetization effects determine a penetration field much smaller than Hc1 in thin films [119], and field inhomogeneities inside the sample are expected (and also directly found [120]) to be irrelevant in thin films for fields greater than a few mT in our temperature range.…”
Section: Cavity Measurementsmentioning
confidence: 99%