2015
DOI: 10.1109/tmtt.2014.2387276
|View full text |Cite
|
Sign up to set email alerts
|

Microwave Properties of an Inhomogeneous Optically Illuminated Plasma in a Microstrip Gap

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

0
23
0

Year Published

2016
2016
2019
2019

Publication Types

Select...
7

Relationship

4
3

Authors

Journals

citations
Cited by 22 publications
(23 citation statements)
references
References 15 publications
0
23
0
Order By: Relevance
“…4 shows the plasma applied to a single slot of the antenna. Unlike the case shown in [20], the region of maximum conductivity is now in line with the region of maximum field strength. The E-field in the space between the slot decays rapidly into the depth of the silicon so that the lower layers of plasma interact very little with the E-field.…”
Section: Modelling Of Lossesmentioning
confidence: 57%
“…4 shows the plasma applied to a single slot of the antenna. Unlike the case shown in [20], the region of maximum conductivity is now in line with the region of maximum field strength. The E-field in the space between the slot decays rapidly into the depth of the silicon so that the lower layers of plasma interact very little with the E-field.…”
Section: Modelling Of Lossesmentioning
confidence: 57%
“…Section IV shows the simulated performance using CST Microwave Studio. Section V shows the measured results and Section VI draws conclusions [15] and diffusion length, Ln=120m [15]. It can be seen that the illumination causes a conductivity maximum close to the silicon surface, and the generated charge carriers diffuse exponentially away from the surface.…”
Section: Introductionmentioning
confidence: 94%
“…It can be seen that the illumination causes a conductivity maximum close to the silicon surface, and the generated charge carriers diffuse exponentially away from the surface. The drop in conductivity at the surface is related to the surface recombination velocity and represents the effects of surface states [15]. (b) Figure 1 also shows how the modelled conductivity profile is converted into nested blocks of differing material properties, which will be subsequently incorporated into the simulation model.…”
Section: Introductionmentioning
confidence: 99%
“…Reconfigurability typically requires either mechanical movement of elements such as MEMS, switching of parasitic elements using varactors, PIN diodes or transistors, or phase weighting, all of which have certain drawbacks . A potential improvement is to exploit optically controlled semiconductors . By illuminating an area of semiconductor, electrons are excited into the conduction band, generating a plasma of free charge carriers.…”
Section: Introductionmentioning
confidence: 99%