Amorphous carbon (a-C) films are deposited using a radical-injection plasma-enhanced chemical vapor deposition (RI-PECVD) system employing a mixture of H 2 and CH 4 gases. Variations in the structural and electronic properties of the resulting films with changes in the residence times of radical species and molecules are investigated by varying the total gas flow rate from 50 to 400 sccm. With decreasing residence time, the deposition rate is found to gradually increase, reaching a maximum value at a residence time of 6 ms, after which a decrease was observed. Optical emission spectra showed that the relative intensity of the CH emission increased with decreasing residence time. These results indicate a change in the dominant radical species resulting from suppression of the dissociation of radicals and molecules. Increasing amorphization and an obvious increase in the Tauc gap from 0.6 to 0.9 eV are found with decreasing residence time, while there is little change in the hydrogen content of the films. From these data, it is evident that control over the structural properties and optical bandgap of a-C films can be realized by optimizing the distribution of radical species.