Microwave near-field imaging of electric fields in a superconducting microstrip resonator

Thanawalla, Ashfaq S.; Dutta, S. K.; Vlahacos, C. P.; Steinhauer, D. E.; Feenstra, B. J.; Anlage, Steven M.; Wellstood, F. C.; Hammond, R. B.

doi:10.1063/1.122492

Cited by 21 publications

(14 citation statements)

References 16 publications

(15 reference statements)

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“…The f 1 image ͓Fig. 3͑a͔͒ is similar to our previous results on this resonator, 10 although the present image shows significantly greater dynamic range because of the use of a spectrum analyzer, rather than a diode, as a detector. The peak signals at either end of the resonator, and the minimum at the center, are consistent with a probe which detects power from just the z component of electric field in the fundamental standing wave pattern of this resonator.…”

supporting

confidence: 88%

“…1. The superconducting resonator under test is installed in a cryogenic scanning microwave microscope 10,11 and capacitively excited by a center conductor pin. Two microwave synthesizers send continuous wave ͑cw͒ tones at frequencies f 1 and f 2 into the device through isolators, amplifiers, and a combiner.…”

mentioning

confidence: 99%

“…The microstrip has a T c of 103 K and a fundamental resonant frequency at 77 K of approximately 8.2 GHz. 10 Figure 2 shows the results of standard ''global'' intermodulation measurements on this resonator as a function of temperature, measured using a probe which is positioned over the end of the resonator opposite the drive pin. The two tones are chosen to be 100 kHz apart to avoid the phase noise of the synthesizers at small frequency separations, and to remain within the middle of the passband of the resonator at 8.2 GHz ͑Qϳ700-1400, depending on tem-perature͒.…”

mentioning

confidence: 99%

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Imaging of microwave intermodulation fields in a superconducting microstrip resonator

Thanawalla

Feenstra

et al. 1999

Applied Physics Letters

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Nonlinearities give rise to intermodulation distortion in superconducting microwave devices and currently limit their use to low power applications. We have developed a cryogenic imaging technique to spatially resolve intermodulation distortion and used it to image an 8.2 GHz high temperature superconducting Tl2Ba2CaCu2O8 microwave resonator. The images reveal that the fundamental and intermodulation electric fields obey a fixed relation throughout the device. We note that further refinements of intermodulation theory in resonant devices may be required to fully describe the data.

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confidence: 88%

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confidence: 99%

mentioning

confidence: 99%

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Imaging of microwave intermodulation fields in a superconducting microstrip resonator

Thanawalla

Feenstra

et al. 1999

Applied Physics Letters

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“…In contrast to scanning probe technology [18,19], our approach avoids cryogenics and eliminates the presence of conducting materials near the sample, therefore minimizing field disturbances. We achieve a 2D spatial resolution of ∼λ MW ∕650, ∼66 μm at ∼6.9 GHz, using a test MW electric field in the form of a standing wave, and image the MW electric field directly above a coplanar waveguide (CPW) to demonstrate near-field imaging.…”

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confidence: 97%

Subwavelength microwave electric-field imaging using Rydberg atoms inside atomic vapor cells

et al. 2014

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We have recently shown that Alkali atoms contained in a vapor cell can serve as a highly accurate standard for microwave electric field strength as well as polarization using the principles of Rydberg atom electromagnetically induced transparency. Here, we show, for the first time, that Rydberg atom electromagnetically induced transparency can be used to image microwave electric fields with unprecedented precision. The spatial resolution of the method is far into the sub-wavelength regime. The electric field resolutions are similar to those we have demonstrated in our prior experiments. Our experimental results agree with finite element calculations of test electric field patterns.Atomic standards are important because they enable stable and uniform measurements and often link physical quantities to each other via universal constants [1]. We have demonstrated in our prior work that atoms contained in a vapor cell can be used for a practical and, in principle, portable microwave (MW) electric field standard using Rydberg atom electromagnetically induced transparency (EIT) [2, 3]. The accurate measurement of MW electric field strength and polarization can lead to advances in applications such as antenna design, device development, characterization of electro-magnetic interference, advanced radar applications and materials characterization [4-9], including metamaterials [10][11][12].To our knowledge, no other work exists on imaging MW electric fields with atoms in vapor cells. Even in the field of magnetometry, where vapor cell magnetometers have played a central part [13], absorption imaging for vapor cell MW magnetometry has only been recently reported [14, 15]. Many of the technical issues of imaging a MW magnetic field as opposed to an electric field with a vapor cell are different. Knowledge of both fields is important. Despite the rather straightforward connection between the electric and magnetic fields in free space, there is not always a simple relation between them in the near field. The absolute measurement of MW electric fields at sub-wavelength resolutions and in the near field is necessary for many MW applications.To meet the need for sub-wavelength imaging of MW electric fields, we demonstrate a scheme for subwavelength MW electrometry using Rydberg atom EIT [16, 17] in Cesium (Cs) atomic vapor cells at room temperature. In contrast to scanning probe technology [18, 19], our approach avoids cryogenics and eliminates the presence of conducting materials near the sample, therefore minimizing field disturbances. We achieve a 2-dimensional spatial resolution of ∼ λ MW /650, ∼ 66 µm at ∼ 6.9 GHz, using a test MW electric field in the form of a standing wave and image the MW electric field di- * Corresponding author: shaffer@nhn.ou.edu rectly above a co-planar waveguide (CPW) to demonstrate near field imaging. The electric field resolution is ∼ 50 µV cm −1 limited by our detection setup. The measurements are compatible with our prior work where we attained a minimum detectable electric field amplitude of ...

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“…Others have studied evanescent fields in the context of imaging as well [14,15]. Several research groups, including our own, have used microwave resonators in the characterization of semiconductors with λ/100 [16][17][18][19][20][21][22][23]. The evanescent microwave probe (EMP) used in our work is a planar structure [19] that readily lends itself to implementation on a silicon cantilever beam.…”

Section: Scanning Evanescent Microwave Probe (Semp)mentioning

confidence: 99%

Multiscale mechanics of hierarchical structure/property relationships in calcified tissues and tissue/material interfaces

Katz

Misra

Spencer

et al. 2007

Materials Science and Engineering: C

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This paper presents a review plus new data that describes the role hierarchical nanostructural properties play in developing an understanding of the effect of scale on the material properties (chemical, elastic and electrical) of calcified tissues as well as the interfaces that form between such tissues and biomaterials. Both nanostructural and microstructural properties will be considered starting with the size and shape of the apatitic mineralites in both young and mature bovine bone. Microstructural properties for human dentin and cortical and trabecular bone will be considered. These separate sets of data will be combined mathematically to advance the effects of scale on the modeling of these tissues and the tissue/biomaterial interfaces as hierarchical material/structural composites. Interfacial structure and properties to be considered in greatest detail will be that of the dentin/adhesive (d/a) interface, which presents a clear example of examining all three material properties, (chemical, elastic and electrical). In this case, finite element modeling (FEA) was based on the actual measured values of the structure and elastic properties of the materials comprising the d/a interface; this combination provides insight into factors and mechanisms that contribute to premature failure of dental composite fillings. At present, there are more elastic property data obtained by microstructural measurements, especially high frequency ultrasonic wave propagation (UWP) and scanning acoustic microscopy (SAM) techniques. However, atomic force microscopy (AFM) and nanoindentation (NI) of cortical and trabecular bone and the dentin-enamel junction (DEJ) among others have become available allowing correlation of the nanostructural level measurements with those made on the microstructural level.

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Microwave near-field imaging of electric fields in a superconducting microstrip resonator

Cited by 21 publications

References 16 publications

Imaging of microwave intermodulation fields in a superconducting microstrip resonator

Imaging of microwave intermodulation fields in a superconducting microstrip resonator

Subwavelength microwave electric-field imaging using Rydberg atoms inside atomic vapor cells

Multiscale mechanics of hierarchical structure/property relationships in calcified tissues and tissue/material interfaces

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