Materials Science and Engineering: B
 1997
DOI: 10.1016/s0921-5107(96)01812-0
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Microwave method for the characterization of transport parameters of heterostructures and narrow gap semiconductor films

T. I. Baturina
1
,
P. A. Borodovski
2
,
S.A. Buldygin
3
et al.
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