2010
DOI: 10.1134/s0020441210020144
|View full text |Cite
|
Sign up to set email alerts
|

Microwave measurements of the pulsed photoconductivity and photoelectric effect

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
7
0
3

Year Published

2012
2012
2024
2024

Publication Types

Select...
6

Relationship

1
5

Authors

Journals

citations
Cited by 20 publications
(10 citation statements)
references
References 5 publications
0
7
0
3
Order By: Relevance
“…15 The films synthesized using the pyrolysis of the aerosols of the aqueous solutions of TCC were deposited at 300 C and annealed at 250 and 350 C for 30 min. 18 The kinetics of the electron trapping processes was measured by the TRMC method 19 at room temperature in a 9 GHz band with the time resolution of 50 ns. This frequency band was selected to detect both the fast and the slow components of photoresponse up to 2 ls.…”
Section: Methodsmentioning
confidence: 99%
“…15 The films synthesized using the pyrolysis of the aerosols of the aqueous solutions of TCC were deposited at 300 C and annealed at 250 and 350 C for 30 min. 18 The kinetics of the electron trapping processes was measured by the TRMC method 19 at room temperature in a 9 GHz band with the time resolution of 50 ns. This frequency band was selected to detect both the fast and the slow components of photoresponse up to 2 ls.…”
Section: Methodsmentioning
confidence: 99%
“…Электрические методы применимы в более общем случае. Одним из таких методов является метод время-разрешенной микроволновой фотопроводимости (FTRMC) [14]. Этот метод позволяет следить за изменением концентрации носителей тока в зоне проводимости.…”
Section: экспериментальная частьunclassified
“…Для определения времени жизни носи- телей тока применяли методику разделения вкладов в фотоотклик P( f , t) сдвига резонансной частоты, δ f 0 , и изменения нагруженной добротности, Q, резонатора. Для этого анализировали зависимости фотоотклика P( f , t) от частоты СВЧ-генератора ( f ) в разные моменты времени (t) [14,15]. Фотопроводимость возбуждали азотным лазером ЛГИ-505 (длина волны λ = 337 нм, длительность импульса 8 нс).…”
Section: экспериментальная частьunclassified
See 1 more Smart Citation
“…μ‐PCD measurement [ 11 ] is widely used in semiconductor industry to study the impurity concentration in silicon wafers [ 12 ] or nonsilicon semiconductors such as CdTe. [ 13 ] This contactless method enables manufacturers to determine impurity concentrations with great accuracy and researchers to gain information on charge carrier dynamics on the nanosecond timescale.…”
Section: Introductionmentioning
confidence: 99%