1985
DOI: 10.1109/tap.1985.1143515
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Microwave holography of large reflector antennas--Simulation algorithms

Abstract: The performance of large reflector antennas can be improved by identifying the location and amount of their surface distortions and then by correcting them. Microwave holography techniqnes are finding considerable applications as viable tools for performing this task.In these techniques, the complex (amplitude and phase) far-field pattern of the antenna is measured, using a reference antenna. Then, the Fourier transform relationship, which exists between the far field and a function related to the induced curr… Show more

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Cited by 63 publications
(25 citation statements)
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“…RF diagnosis techniques have been proposed to reconstruct the near field over a radiating aperture [26]. The phase shift of the reflectarray elements can thus be reconstructed.…”
Section: Detection Of Wood's Anomaliesmentioning
confidence: 99%
“…RF diagnosis techniques have been proposed to reconstruct the near field over a radiating aperture [26]. The phase shift of the reflectarray elements can thus be reconstructed.…”
Section: Detection Of Wood's Anomaliesmentioning
confidence: 99%
“…BEN-NETT, et al [10] presented a sufficiently detailed analysis of this method to draw the attention of radio astronomers. SCOTT and RYLE [11] used the new Cambridge 5 km array to measure the shape of four of the eight antennas, using a celestial radio point source and the remaining antennas to provide the reference signal Simulation algorithms were developed by RAHMAT-SAMII [12] and others [13][14][15][16], adding to the practicability of the method. Using the giant water vapour maser at 22 GHz in Orion as a source, MOR-RIS, et al [17] achieved a measurement accuracy of 30 microns and were set the surface of the IRAM 30 m millimeter telescope to an accuracy of better than 100 microns.…”
Section: Introductionmentioning
confidence: 99%
“…With this information, it is possible to detect errors, and also to identify which are the causes of such errors, for example, electrical errors in arrays or mechanical errors in reflectors. These classical applications have been widely studied in applications [1]- [2]. The presence of these errors affects to the far field pattern but, often these errors are very difficult to be detected from this pattern.…”
Section: Introductionmentioning
confidence: 99%