Microwave dielectric properties of pure and Mn-doped lead-free Na0.5Bi0.5TiO3epitaxial thin films grown on (001) LaAlO3single crystals using pulsed laser deposition
Abstract:(001)‐epitaxial thin films of pure and Mn‐doped lead‐free Na0.5Bi0.5TiO3 (NBT) were grown on (00l) LaAlO3 single crystals, by pulsed laser deposition. The determination of the microwave dielectric permittivity, from interdigitated capacitance values treated using the combination of two previously developed analytical models, constitutes the backbone of this work. In the 3–5 GHz frequency range, constant ϵr values of ∼485 and ∼515 for the pure and Mn‐doped layers, respectively, were extracted and found in good … Show more
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