Microwave Analysis of Scattered and Absorbed Powers of Semiconductor and Metamaterial Cylinder Structures

Abstract

Here is presented our numerical investigations based on the rigorous solution of the Maxwell’s equations for analyses of absorbed and scattered powers of a semiconductor-metamaterial array with a window defect. The array structure consists of a finite set of infinite parallel, circular cylinders that can be made of the different lossy and/or lossless isotropic materials. We used our developed computer code, which allowed us to consider an array consisting of an arbitrary number of cylinders. According to our code, cylinders can be located at different distances and have differing diameters. There is a limitation: Cylinders should not cross each other. We numerically examined two cylindrical arrays with electromagnetic (EM) band-gap (EBG) defects. The absorbed and scattered powers were analyzed there for parallel and perpendicular polarizations of the incident microwave. We investigated dependencies on the operating frequency and the radius (R) of an arc of the arranged thirteen n-Si cylinders with the low semiconductor specific resistivity of 0.5, 2, and 10 Ω∙m. We have discovered that the arrays may have features of a waveguide or a microwave reflector.