2003
DOI: 10.1063/1.1556969
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Microwave absorption on a thin film

Abstract: With the use of a simple model, it is shown that a thin film of contaminant on a microwave window may absorb up to 50% of the incident power, even if the film thickness is only a small fraction of its resistive skin depth. This unexpectedly large amount of absorption is conjectured to have played a significant role in window failure. The temperature rise in a thin film is estimated.

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Cited by 118 publications
(88 citation statements)
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“…It should be noted here that the maximal absorption results have been obtained in several previous publications for other thin film systems. 5,[15][16][17][18] The typical square resistance is ∼10 −2 for a skin depth thickness of noble metal film in microwave frequencies, and thus the incident microwave is almost exclusively reflected due to the huge mismatch between R s and Z 0 . In order to enhance the EM dissipation in the film, we need decrease σ or h or both.…”
mentioning
confidence: 99%
“…It should be noted here that the maximal absorption results have been obtained in several previous publications for other thin film systems. 5,[15][16][17][18] The typical square resistance is ∼10 −2 for a skin depth thickness of noble metal film in microwave frequencies, and thus the incident microwave is almost exclusively reflected due to the huge mismatch between R s and Z 0 . In order to enhance the EM dissipation in the film, we need decrease σ or h or both.…”
mentioning
confidence: 99%
“…Bosman et al 16) have studied microwave absorption of contaminant (supposing as thin film disk) on a microwave window. According to the results, the temperature rise of the contaminant was expressed as:…”
Section: Discussionmentioning
confidence: 99%
“…Depth of penetration, that is, skin depth (defined as the distance from the surface into the material at which the power drops to e À1 of the original value) is given by 16)…”
Section: Discussionmentioning
confidence: 99%
“…The variation of this parameter (δ) depends on the characteristics of the metallic material used in the film production, mainly its electric conductivity, and also on the incident radiation wavelength that interacts with the film (Ohring, 1991). When the metallic layer thickness is adequate, the resulting electric current becomes confined into the film (Salmon, 1993) and losses occur (Bosman, Lau and Gilgenbach, 2003;Shubin, et al, 2000).…”
Section: Introductionmentioning
confidence: 99%