2017
DOI: 10.1016/j.compscitech.2017.08.001
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Microwave absorbing properties of composites containing ultra-low loading of optimized microwires

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Cited by 34 publications
(21 citation statements)
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“…When the EM wave absorption layer thickness equals a quarter of a wavelength, the interference of the reflected EM wave from the upper and lower surfaces occurs, corresponding to RL min . This can be expressed by the following equation:n=4dfεrμrcfalse(n=1,3,5,false)where d is the sample thickness; f is the frequency; ε r and μ r are the complex permittivity and permeability, respectively; and c is the velocity of light in vacuum . The value of n of PCHMs@ZnO‐700 with a thickness of 3.8 mm is calculated according to this equation.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…When the EM wave absorption layer thickness equals a quarter of a wavelength, the interference of the reflected EM wave from the upper and lower surfaces occurs, corresponding to RL min . This can be expressed by the following equation:n=4dfεrμrcfalse(n=1,3,5,false)where d is the sample thickness; f is the frequency; ε r and μ r are the complex permittivity and permeability, respectively; and c is the velocity of light in vacuum . The value of n of PCHMs@ZnO‐700 with a thickness of 3.8 mm is calculated according to this equation.…”
Section: Resultsmentioning
confidence: 99%
“…where d is the sample thickness; f is the frequency; ε r and μ r are the complex permittivity and permeability, respectively; and c is the velocity of light in vacuum. 39 The value of n of PCHMs@ZnO-700 with a thickness of 3.8 mm is calculated according to this equation. As shown in Figure 8B, when n is 1, the frequency of destructive interference is not equal to the frequency of RL min , which indicates that destructive interference is not the dominant mechanism for EM wave absorption ability.…”
Section: Dielectric and Em Wave Absorption Propertiesmentioning
confidence: 99%
“…The surface characterization of the samples was performed by X-ray photoelectron spectroscopy (Kratos AXIS Supra) and contact angle measurements (DataPhysics Instruments OCA 20). The scattering parameters of all samples were measured by the Rohde&Schwarz ZNB 20 vector network analyzer (VNA) using WR90 waveguide in TE 10 dominant mode frequency range [18,19] from 8.5 GHz to 11 GHz. The VNA was calibrated by the thru-reflect-line (TRL) [20] method and the measurements were performed on transmission mode.…”
Section: Characterization Techniquesmentioning
confidence: 99%
“…Recently, in Reference 12, Ji et al have used plasma and metamaterial as coating layers defined and analyzed by finite‐difference time‐domain (FDTD) method for RCSR of a cylinder. Similar to the shaping methods, coatings suffer from narrow RCSR bandwidth and high fabrication complexity. Using absorbent materials : absorbent materials (ie, radar absorbent material (RAM), 13‐22 microwave‐absorbing material (MAM), 21,23‐27 high impedance surface (HIS), 28‐30 and metamaterial absorber (MA)/ perfect metamaterial absorber (PMA) 31‐45 ) have been studied since 1950s 1 . These materials are lossy layers loaded on the target 46 which absorb the incoming EM energy and transform it into heat so that the backscattered EM wave to the radar receiver is decreased.…”
Section: Introductionmentioning
confidence: 99%
“…Later, some works have been proposed to improve the bandwidth, 15‐17 the thickness, 13 the incident angle region 15,18 of the Salisbury screen structures. Afterward, several RAM and MAM structures have been proposed and developed for RCSR in a wider range of frequency with different numbers of layers 19,20,26 . Recently, a comparative study has been conducted in Reference 21 between different approaches of RAM structures whose reflectivity value was less than −16 dB on average in a frequency band of 8 to 26 GHz for TE/TM modes and incident angles up to 50°.…”
Section: Introductionmentioning
confidence: 99%