2008
DOI: 10.1016/j.msea.2007.10.016
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Microtomographic study of the evolution of microstructure during creep of an AlSi12CuMgNi alloy reinforced with Al2O3 short fibres

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Cited by 34 publications
(30 citation statements)
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“…This can be overcome by means of synchrotron tomography where the phase contrast can be exploited to resolve the eutectic Si from the Al. [10,11] Furthermore, the contrast between these two phases can be improved by means of holotomography for which a map of the electron density of the phases is obtained. [12] Taking all these facts into account, the objective of the present work is to bridge the gap between the already available results that make use of 2D methodologies to characterize the binary AlSi12 system (see e.g.…”
mentioning
confidence: 99%
“…This can be overcome by means of synchrotron tomography where the phase contrast can be exploited to resolve the eutectic Si from the Al. [10,11] Furthermore, the contrast between these two phases can be improved by means of holotomography for which a map of the electron density of the phases is obtained. [12] Taking all these facts into account, the objective of the present work is to bridge the gap between the already available results that make use of 2D methodologies to characterize the binary AlSi12 system (see e.g.…”
mentioning
confidence: 99%
“…[5] The edge enhancement resulting from the phase contrast mode produces the necessary contrast between phases having similar mass densities, as it is the case for the Al matrix and the eutectic Si, present in the investigated SFRM. Artificial fringes in the interfaces were present due to the nature of the contrast phase technique but a relative comparison between the investigated conditions was possible.…”
Section: Description Of the Materialsmentioning
confidence: 81%
“…[2][3][4] To ensure the reliability of such materials under long-term temperature/load exposure, the mechanisms controlling their thermomechanical behavior are to be known.In previous studies, [3,5] an SF reinforced AlSi12CuMgNi alloy showed a decrease in stationary creep rate with the creep exposure time extending several thousand hours at 300 8C. Microtomographic evaluations [5] revealed microstructural changes of the Si phase, specially of the interconnectivity between Si, SFs, and intermetallics.…”
mentioning
confidence: 83%
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