Microtexture determination in Fe–Si alloy sheets by etch pitting. Comparison with the electron back-scattering pattern technique

Baudin, Thierry; Paillard, Pascal; Cruz, Felipe Mendes da; Pénelle, R.

doi:10.1107/s0021889894005194

Cited by 6 publications

(2 citation statements)

References 6 publications

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“…The microstructure and crystallography of the martensitic variants in the annealed samples were investigated by electron backscatter diffraction (EBSD) (Dingley & Wright, 2009;Baudin et al, 1994) in a JEOL JSM 6500 high-resolution scanning electron microscope equipped with a field emission gun. The samples for the EBSD measurements were first mechanically and then electrolytically polished.…”

Section: Methodsmentioning

confidence: 99%

Modification of preferred martensitic variant distribution by high magnetic field annealing in an Ni–Mn–Ga alloy

et al. 2011

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The preferred martensitic variant distribution in Ni 53 Mn 25 Ga 22 ferromagnetic shape memory alloy (FSMA) samples annealed without and with a high magnetic field of 12 T applied during the annealing process was investigated by electron backscatter diffraction. It is revealed that the high magnetic field applied during annealing enhances the regular arrangement of martensitic variants from the morphological point of view and effectively modifies the preferred orientation distribution of martensitic variants without changing the misorientation between them from the crystallographic point of view. Only one texture component, f110gh332i, exists in the sample annealed without a magnetic field, whereas two additional texture components, f463gh312i and f110gh110i, are developed in the sample annealed in a high magnetic field. The new finding that the preferred martensitic variant distribution can be efficiently modified by introducing a high magnetic field during the annealing process will shed light on the development of high-performance polycrystalline FSMAs via novel processing techniques. Figure 5(a) ODF sections with '2 constant (0 , 5 , 10 etc.) in the Ni 53 Mn 25 Ga 22 samples annealed without a magnetic field.

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Section: Methodsmentioning

confidence: 99%

Modification of preferred martensitic variant distribution by high magnetic field annealing in an Ni–Mn–Ga alloy

et al. 2011

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“…En rive de bande, les grains sont equiaxes et de forte taille (300 à 400 ym). La texture cristallographique de l'échantillon brut de coulée a été déterminée par difiaction des rayons X et par analyse de microfigures de corrosion [6]. La composante principale proche de {100)<0vw> trouvée est une texture de solidification rapide classique pour des échantillons coulés entre rouleaux.…”

Section: Procedures Experzmentales Et Caracterisation Microstructuraleunclassified

Simulation et Caractérisation des Textures de Recristallisation d'un Alliage Fer 3% de Silicium Obtenu par Coulée Directe en Bande Mince

1995

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A critical review of orientation microscopy in SEM and TEM

Zaefferer

2011

Cryst. Res. Technol.

127

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Orientation microscopy (OM) refers to techniques for reconstruction of microstructures based on the spatially resolved measurement of individual crystallographic phases and orientations. This review gives an overview on different techniques of OM in the scanning and transmission electron mi-croscope. All rely on the automated evaluation of electron diffraction patterns. The most popular technique is based on electron backscatter diffraction (EBSD) in the SEM. In the TEM several techniques are available which are based on either Kikuchi diffraction patterns, spot diffraction patterns with and without electron precession, or reconstructed spot diffraction patterns. Each technique is introduced in detail. Subsequently the techniques are critically compared with respect to their spatial and angular resolution, their robustness in terms of orientation determination and questions of practical applicability for materials science. One point discussed in detail is the spatial resolution. It is shown that the spatial resolution, i.e. the volume from which the diffraction information is generated, is not very different for the SEM and TEM techniques. For this and other reasons we argue that the EBSD technique is in many cases the best suited method for OM. In those cases where it is not (e.g. investigations on truly nanocrystal-line materials, beam sensitive samples) it is the spot diffraction method combined with electron precession and template matching for orientation determination which offers the best resolution and robustness. The Kikuchi pattern technique in the TEM is only reasonably used when highest angular resolution is to be achieved, e.g. for lattice constant determination.

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Microtexture determination in Fe–Si alloy sheets by etch pitting. Comparison with the electron back-scattering pattern technique

Cited by 6 publications

References 6 publications

Modification of preferred martensitic variant distribution by high magnetic field annealing in an Ni–Mn–Ga alloy

Modification of preferred martensitic variant distribution by high magnetic field annealing in an Ni–Mn–Ga alloy

Simulation et Caractérisation des Textures de Recristallisation d'un Alliage Fer 3% de Silicium Obtenu par Coulée Directe en Bande Mince

A critical review of orientation microscopy in SEM and TEM

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