Microstructures and magnetic properties of [SiO2/FePt]5/Ag thin films

Abstract

Abstract： [SiO 2 /FePt] 5 /Ag thin films were deposited by RF magnetron sputtering on the glass substrates and post annealing at 550 ℃ for 30 min in vacuum. Vibrating sample magnetometer and X-ray diffraction analyser were applied to study the magnetic properties and microstructures of the films. The results show that without Ag underlayer [SiO 2 /FePt] 5 films deposited onto the glass are FCC disordered; with the addition of Ag underlayer [SiO 2 /FePt] 5 /Ag films are changed into L1 0 and (111) mixed texture. The variation of the SiO 2 nonmagnetic layer thickness in [SiO 2 /FePt] 5 /Ag films indicates that SiO 2 -doping plays an important role in improving the order parameter and the perpendicular magnetic anisotropy, and reducing the grain size and intergrain interactions. By controlling SiO 2 thickness the highly perpendicular magnetic anisotropy can be obtained in the [SiO 2 (0.6 nm)/FePt (3 nm)] 5 /Ag (50 nm) films and highly (001)-oriented films can be obtained in the [SiO 2 (2 nm)/FePt (3 nm)] 5 /Ag (50 nm) films.

Effects of Ag layers on the microstructure and magnetic properties of CoPt/BN multilayer films

“…A (001) texture has been found in CoPt/SiO 2 granular films with a small content of Ag additions [9]. In previous studies, the ordered CoPt [10] and FePt [11][12] films with (001) preferred orientation were deposited on the Ag underlayer by DC magnetron sputtering. Nonmagnetic BN-doping is of great benefit for getting small particle sizes, isolating magnetic grains, and improving (001)-texture [13][14][15].…”