2012
DOI: 10.1016/j.jcrysgro.2012.05.042
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Microstructure of epitaxial YBa2Cu3O7−δ thin films grown on Pb(Mg1/3Nb2/3)0.7Ti0.3O3 substrates

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Cited by 3 publications
(1 citation statement)
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“…Perovskite-type binary and ternary ferroelectric (FE) single crystals of (1 -x)Pb(Mg [17][18][19][20] as well as large ferroelectric-domain-switching-induced lattice strains, which can be reversibly, continuously, and quantitatively tuned by simply applying dc or ac electric fields to the FE crystals along the thickness direction. As of now, finely polished (001)-, (011)-, and (111)-cut PMN-xPT and PIN-xPMN-yPT single crystals have been used as substrates to grow a variety of thin films, such as R 1-x A x MnO 3 (R = La, Pr, A = Ca, Sr, Ba) [21][22][23][24][25][26][27][28][29], Co [30,31], BiFeO 3 [32], YBa 2 Cu 3 O 7 [33,34], BaTiO 3 :Yb/Er [35,36], AFe 2 O 4 (A = Co, Ni) [37,38], Fe 3 O 4 [39,40], and Bi 0.94 Pb 0.06 CuSeO [41], so that the lattice strain and the related properties of these films could be in situ modified. Virtually, using this unique method, the intrinsic lattice strain effects of any films grown on FE substrates can be studied without introducing extrinsic effects caused by the variation in oxygen content, thickness of the dead layer, defects, crystallinity, disorder, and so on.…”
Section: Introductionmentioning
confidence: 99%
“…Perovskite-type binary and ternary ferroelectric (FE) single crystals of (1 -x)Pb(Mg [17][18][19][20] as well as large ferroelectric-domain-switching-induced lattice strains, which can be reversibly, continuously, and quantitatively tuned by simply applying dc or ac electric fields to the FE crystals along the thickness direction. As of now, finely polished (001)-, (011)-, and (111)-cut PMN-xPT and PIN-xPMN-yPT single crystals have been used as substrates to grow a variety of thin films, such as R 1-x A x MnO 3 (R = La, Pr, A = Ca, Sr, Ba) [21][22][23][24][25][26][27][28][29], Co [30,31], BiFeO 3 [32], YBa 2 Cu 3 O 7 [33,34], BaTiO 3 :Yb/Er [35,36], AFe 2 O 4 (A = Co, Ni) [37,38], Fe 3 O 4 [39,40], and Bi 0.94 Pb 0.06 CuSeO [41], so that the lattice strain and the related properties of these films could be in situ modified. Virtually, using this unique method, the intrinsic lattice strain effects of any films grown on FE substrates can be studied without introducing extrinsic effects caused by the variation in oxygen content, thickness of the dead layer, defects, crystallinity, disorder, and so on.…”
Section: Introductionmentioning
confidence: 99%