] 1IntroductionFor future applications in penetrators, insensitive high explosives are requiredi no rdert os urviveh eavy mechanical loading, e.g. during supersonic penetration of concrete or rock [1,2].P lastic bondedh igh explosives (PBX) used e.g. in penetrator systemsa re highly filled polymers containing up to 90 mass %s olid filler load in multi-modal distribution. In recent years, the microstructure of crystalline ingredients, such as RDX and HMX, came under the scrutiny of research, when it was discovered that incorporating meticulously recrystallized particles reduces the shock sensitivity of PBXs. In this context particle size, particle shape,s urface morphology,v oids, inclusions, impurities, dislocations, and twinning have been discussedt oi nfluence the mechanical and shocks ensitivity by the creation of hot spots during shock-loading.Optical microscopy is widely used to examine microstructural changes of PBX and energetic crystalss uch as HMX, RDX, and TATB after uniaxial or hydrostatic compression, microindentation, low velocityi mpact, or even shock loading. Such kind of investigation uncover deformation and failure of and cracking paths through PBXs and show micromechanical processes such as plasticity, solid state transformations, and anisotropic behavior of crystals with shear and deformation bands, dislocations lipping,d eformation twinning,m icrocracking at distinct lattice planes, and the evolution of crack arrays [3][4][5][6][7][8].H owever ac areful preparation and/or surface polishing technique is required to avoid introducing defects by the preparation itself and furthermore the quantification of the effectsi sd ifficult and,w ith the limited surface areas investigated, results might not be representative for the whole samples.X-ray and Neutron techniques provide significant penetration to obtain information not only from the surface and provide in case of X-ray microtomography or computer tomography three dimensional images of PBXsw ith resolutions approaching the nano scale [9].I nc ontrast to the imaging methods, small angle X-ray,N eutron analysis, and X-ray powder diffraction (XRD) delivers volume-averaged results, representative for the samplesi nvestigated, and ultrafast synchrotron approaches may even allow observing in situ diffraction data of PBXs during impact [10].Small angle studies for instanceq uantify the interface betweenf iller and binder,a nd of the pores in PBX, and revealed fracture of filler particles in heavily mechanically damaged PBX samples [11].X -ray diffraction techniques (XRD) provide information on the crystal structures and their anisotropic behaviorr elatedt oc rystal defectss uch as dislocation slip systems and deformation twinning [12][13][14], and quantify crystallites ize and microstrain in energetic Abstract:N on-destructive X-ray diffraction techniques were applied in order to monitort he influence of mechanical and shock-loading on the microstructure of the plasticbonded high explosive KS32.T he investigations uncovered damage to embedded coarse HM...