2015
DOI: 10.1017/s1431927615007540
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Microstructure evolution of a Cu and θ-AI2O3 composite observed by aberration corrected HAADF-STEM

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“…Those thin films were examined by a Talos F200S scanning/ transmission electron microscope (Thermal Fisher Scientific). Here, instead of conventional TEM, an incoherent imaging method 58,59 (HAADF) was applied to reveal the texture of the aligned thin films. EDS maps were acquired under a high electron beam current (spot size 6).…”
Section: Methodsmentioning
confidence: 99%
“…Those thin films were examined by a Talos F200S scanning/ transmission electron microscope (Thermal Fisher Scientific). Here, instead of conventional TEM, an incoherent imaging method 58,59 (HAADF) was applied to reveal the texture of the aligned thin films. EDS maps were acquired under a high electron beam current (spot size 6).…”
Section: Methodsmentioning
confidence: 99%