Microstructure characterization of porous silicon as studied by positron annihilation measurements at low temperatures and high vacuum

The fabrication and characteristic investigation of microstructured silicon with different spike heights

“…In order to avoid the problems mentioned above, people try to fabricate similar material in the ambient of vacuum [19][20][21]. Under these cases, it is found that the antireflection capacity of material can be further increases.…”

Genetic Algorithms for Positron Lifetime Data

“…[2] for Si. On the other hand, numerous measurements [3][4][5] still differ in precise determination of these lifetimes. One reason for the discrepancies are differences in experimental setups, another can be details of the numerical procedures used for analysis of the lifetime spectra.…”