Microstructure and Texture of Polycrystalline CVD‐ZnS Analyzed via EBSD

Abstract

Polycrystalline ZnS samples are studied using X‐ray diffraction and scanning electron microscopy including electron backscatter diffraction (EBSD). The material is industrially produced by a chemical vapor deposition process (CVD). Near the substrate, crystal growth leads to grains smaller than 50 μm in the cut plane. Elongated crystals with visible lengths of up to 400 μm are formed further from the substrate. These crystals are heavily twinned and exhibit Σ3 grain boundaries (i.e., the orientation of one {111}‐plane is constant while rotations of 60° around its normal occur). About 1000 μm from the substrate, the grain size shrinks to about 20 μm along an abrupt border; a continuous grain size transition is not observed. Gradual orientation changes within single grains occur and in some cases lead to the fragmentation of grains parallel to the direction of growth. This is preferably observed in smaller grains more than 1000 μm from the substrate. Twinning, on the other hand, predominantly occurs in the large grains near the substrate. Both mechanisms should contribute to stress minimization in the sample. Textures of the analyzed surfaced indicate a general <001>‐orientation perpendicular to the substrate and thus parallel to the direction of crystal growth.

The effect of samarium doping on structure and enhanced thermionic emission properties of lanthanum hexaboride fabricated by spark plasma sintering

“…3.3 EBSD analysis of crystallographic orientation for (La 0.6 Sm 0.4 )B 6 The grain orientations and size distributions of (La 0.6 Sm 0.4 )B 6 were examined by the EBSD technique. The orientation at each point was determined [37]. Spatial distributions of the grain orientations are mapped by different colors based on a theoretical calculation of the measured diffraction patterns [38].…”

An In‐Depth Study of Zn Metal Surface Chemistry for Advanced Aqueous Zn‐Ion Batteries

“…When the temperature was increased to 350 °C, the XRD pattern displayed new peaks at 28.6°, 47.5°, and 56.3°, corresponding to the (111), (220), and (311) planes of ZnS (PDF # 00-005-0566), respectively. [18] The intensity of these peaks increased when the temperature was increased to 400 °C. Figure S13 (Supporting Information) presents digital images of ZnS@Zn electrodes obtained at different temperatures, with the ZnS@Zn-300 foil showing almost no change in colors or luminosity.…”

Polarity Determination in EBSD Patterns Using the Hough Transformation

“…Here, the question of whether these layers form via polar oriented nucleation at the surface or polar selection during growth into the bulk remains unanswered , but could be solved via EBSD. In another example, a preferred orientation has been shown to occur during the chemical vapor deposition (CVD) of polar layers on a nonpolar substrate (McCloy & Korenstein, 2009;Zscheckel et al, 2012). In both cases, knowing the orientation of the polar axis could clarify the growth mechanism (Moore et al, 2004;Zscheckel et al, 2012Zscheckel et al, , 2014 and help to optimize the physical properties connected with the polarity (Sumathi & Gille, 2014).…”