2018
DOI: 10.1007/s11666-018-0785-0
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Microstructure and Micromechanical Response in Gas-Atomized Al 6061 Alloy Powder and Cold-Sprayed Splats

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Cited by 34 publications
(30 citation statements)
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“…EBSD informed nanoindentation analysis found that the orientation aligned with the [111] direction had a hardness of 1.25 GPa while the [101] direction had a hardness of 0.73 GPa, as shown in Figure 27. The average hardness was determined to be 1.17 GPa for the powder which is consistent with gas-atomized Al 6061 powder as reported in [7,38,77].…”
Section: Orientation-dependent Powder Propertiesmentioning
confidence: 97%
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“…EBSD informed nanoindentation analysis found that the orientation aligned with the [111] direction had a hardness of 1.25 GPa while the [101] direction had a hardness of 0.73 GPa, as shown in Figure 27. The average hardness was determined to be 1.17 GPa for the powder which is consistent with gas-atomized Al 6061 powder as reported in [7,38,77].…”
Section: Orientation-dependent Powder Propertiesmentioning
confidence: 97%
“…Additionally, the nanoindentation modulus of elasticity of the powder grains as a function of crystallographic orientation was measured. The grain aligned with the [111] direction had a modulus of 74.12 GPa while the grain aligned with the [101] direction had an elastic modulus of 65.34 GPa.…”
Section: Orientation-dependent Powder Propertiesmentioning
confidence: 99%
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“…Per the need for continued consideration of the literature reported to date surrounding gas-atomized Al 6061 powder particle microstructures, Bedard et al was considered first herein. More to the point, Bedard et al claimed to have observed "cell-like solidification microstructures" in their Al 6061 feedstock [42]. Beyond the work of Bedard et al, Ernst et al purported that "cellular-dendritic", i.e., compound-like, solidification microstructures were observable in another gas-atomized Al 6061 powder [43].…”
Section: Resultsmentioning
confidence: 99%
“…It has been seen that SEM can be insufficient to show secondary phases of a few micron diameter; therefore, transmission electron microscopy (TEM) is preferred [ 16 , 17 , 18 , 19 , 20 ] to observe the submicron phases. Samples were created for TEM imaging using a gallium focused ion beam (FIB) (FEI Helios 660 Nanolab and FEI Scios Dual Beam FIBs) in a method similar to that employed by Tsaknopoulos et al [ 17 ].…”
Section: Methodsmentioning
confidence: 99%