2024
DOI: 10.1007/s10853-024-09715-0
|View full text |Cite
|
Sign up to set email alerts
|

Microstructure and mechanical properties of Ti-Nb alloys: comparing conventional powder metallurgy, mechanical alloying, and high power impulse magnetron sputtering processes for supporting materials screening

M. Marczewski,
K. Wieczerzak,
X. Maeder
et al.

Abstract: At the interface of thin film development and powder metallurgy technologies, this study aims to characterise the mechanical properties, lattice constants and phase formation of Ti-Nb alloys (8–30 at.%) produced by different manufacturing methods, including conventional powder metallurgy (PM), mechanical alloying (MA) and high power impulse magnetron sputtering (HiPIMS). A central aspect of this research was to investigate the different energy states achievable by each synthesis method. The findings revealed t… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2024
2024
2024
2024

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 90 publications
0
1
0
Order By: Relevance
“…Overall, E-TOFMS is a versatile tool for the analysis of complex plasma processes involving multiple energetic and chemical species, therefore in particular suitable for supporting development in thin film technology, where the IEDF for multiple ions is of interest. Examples of such areas include the development of high entropy alloy or compound films, where the energy of the impinging species influences the structure and microstructure of the grown film, ,,, or optimisation of thin film systems and interfaces in electronics, photovoltaics, and energy storage. The presented applications focus on PVD, specifically magnetron sputtering, however, it is likely that it will prove to be useful in the context of plasma enhanced chemical vapor deposition and atomic layer deposition (PE-CVD, PE-ALD) in general, where information on the IEDF and the nature of the ionic species involved in film growth are important for understanding the growth mechanism.…”
Section: Discussionmentioning
confidence: 99%
“…Overall, E-TOFMS is a versatile tool for the analysis of complex plasma processes involving multiple energetic and chemical species, therefore in particular suitable for supporting development in thin film technology, where the IEDF for multiple ions is of interest. Examples of such areas include the development of high entropy alloy or compound films, where the energy of the impinging species influences the structure and microstructure of the grown film, ,,, or optimisation of thin film systems and interfaces in electronics, photovoltaics, and energy storage. The presented applications focus on PVD, specifically magnetron sputtering, however, it is likely that it will prove to be useful in the context of plasma enhanced chemical vapor deposition and atomic layer deposition (PE-CVD, PE-ALD) in general, where information on the IEDF and the nature of the ionic species involved in film growth are important for understanding the growth mechanism.…”
Section: Discussionmentioning
confidence: 99%