Microstructure analysis of spherical silicon solar cells with SnOx:Fy layers

Shirahata, Yasuhiro; Oku, Takeo; Kanamori, Youichi; Murozono, Mikio

doi:10.1063/1.4941220

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2017

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“…XRD measurements were carried out 20 times for each sample because the present Si spheres were single crystals, and the orientation plane of the Si spheres could not be controlled. 12),13),21), 22) Hundreds of spherical Si single crystals were randomly placed on the sample holder, and the sample setting was changed for each measurement. The XRD patterns were picked out from the measurement results.…”

Section: Methodsmentioning

confidence: 99%