2000
DOI: 10.1117/12.401630
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Microstructural study of silicon carbide fibers through the use of Raman microscopy

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Cited by 11 publications
(21 citation statements)
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“…[12][13][14] RMS analyses (LABRAM 010 and HR from Dilor, France) were carried-out on the same samples as those for EPMA. The excitation source was the 633 nm emission line of a He/Ne laser.…”
Section: Methodsmentioning
confidence: 99%
“…[12][13][14] RMS analyses (LABRAM 010 and HR from Dilor, France) were carried-out on the same samples as those for EPMA. The excitation source was the 633 nm emission line of a He/Ne laser.…”
Section: Methodsmentioning
confidence: 99%
“…1). [1][2][3] The broad carbon features correspond to a very disordered form (turbostratic, with heavily distorted graphene layers). The various optical modes evidenced for the 6H-SiC crystal are also present for the outer CVD-SiC.…”
Section: Raman Features Of Sic-based Materialsmentioning
confidence: 99%
“…3,15,16 In order to investigate the disorder ranges induced by irradiation, a phonon confinement model was applied to 3C-SiC to simulate the Raman spectra. 3,15,16 The intensities I i (ω) of the various phonons i were integrated along all the acoustic (TA, LA) and optic (TO, LO) branches ω i (q), within the Brillouin zone (0 ≤ q ≤ 1), using the weighing function f(q, L) = exp(−q 2 L 2 /4), centred on q = 0, where q is the reduced wave vector, L is a dimensionless parameter (L = 1 correspond to the nearest-neighbour Si (or C) planes) and Γ 0i are the linewidths of the undistorted Raman lines (all arbitrary fixed at Γ 0i = 10 cm −1 , Eq. (1))…”
Section: Rms Analysis Of the Irradiated 6h-sic Crystal And Htr Particlementioning
confidence: 99%
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