1997
DOI: 10.1016/s0022-3115(96)00678-2
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Microstructural study of an irradiated high-nickel alloy by X-ray line profile analysis and TEM observations

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Cited by 6 publications
(2 citation statements)
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“…For the deformed sample, a possible source of error in the TEM measurements is the great difficulty in counting individual dislocations in the dense dislocation tangles of highly deformed samples (Figure 7), favoring an underestimate of the dislocation density, as previously reported by Sousa et al 22 and Bailey and Hirsch 12 . Thus, despite the differences, values found by XRD and TEM can be considered appropriate and self-consistent 23 . While the TEM results were presumably impacted by systematic errors, which can be reduced increasing the number analyzed areas Another goal of this work was to compare the values of the dislocation density measured by XRD and TEM.…”
mentioning
confidence: 83%
“…For the deformed sample, a possible source of error in the TEM measurements is the great difficulty in counting individual dislocations in the dense dislocation tangles of highly deformed samples (Figure 7), favoring an underestimate of the dislocation density, as previously reported by Sousa et al 22 and Bailey and Hirsch 12 . Thus, despite the differences, values found by XRD and TEM can be considered appropriate and self-consistent 23 . While the TEM results were presumably impacted by systematic errors, which can be reduced increasing the number analyzed areas Another goal of this work was to compare the values of the dislocation density measured by XRD and TEM.…”
mentioning
confidence: 83%
“…Thus, despite the difference, it can be stated that the values found by both XRD and TEM analysis are appropriate and consistent 11,12 . Although the TEM results were impacted by systematic errors, these could be improved increasing the number of samples and regions analyzed, which is costly and slow.…”
Section: Resultsmentioning
confidence: 74%