1993
DOI: 10.1109/20.281291
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Microstructural origin of the perpendicular anisotropy in M-type barium hexaferrite thin films deposited by RF magnetron sputtering

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Cited by 73 publications
(28 citation statements)
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“…The x-ray diffraction study on the as-deposited barium and strontium ferrite films also showed them to be amorphous. 7,15,16 The absence of certain peaks in the thin films could be due to some sort of texture in the thin films.…”
Section: A Xrdmentioning
confidence: 99%
“…The x-ray diffraction study on the as-deposited barium and strontium ferrite films also showed them to be amorphous. 7,15,16 The absence of certain peaks in the thin films could be due to some sort of texture in the thin films.…”
Section: A Xrdmentioning
confidence: 99%
“…4, which suggests good c-axis orientation perpendicular to the film plane. To explain this effect, we refer to the work of Sui et al [22]. This work suggested that the platelet grains have a c-axis orientation perpendicular to the film plane and that the acicular grains have a c-axis orientation in the film plane.…”
Section: Magnetic Propertiesmentioning
confidence: 94%
“…It has been shown previously that the crystallization of hexaferrites is a very slow process 30 and that other techniques for film preparation also require annealing. [31][32][33][34][35] The substrate temperature reached a maximum of 400 • C for these experiments; this is too low, if we consider that 600-900 • C 14 is necessary for the higher crystallinity of the hexaferrites. In order to promote the crystallization of Ba hexaferrite the coatings were annealed.…”
Section: The Ba Hexaferrite Coatingsmentioning
confidence: 98%