1999
DOI: 10.4028/www.scientific.net/kem.175-176.321
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Microstructural Degradation Accompanying Tensile Creep Deformation in Quasi-Ductile Silicon Nitride

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Cited by 4 publications
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“…Our earlier studies found out that Yb and Al concentrations correlate with individual layers. [13][14][15][16] The concentration of Al increased in the zone from 30 to 100% of total thickness of the oxidation affected zone compared to the bulk, whereas Yb concentration was lower there with the exception of large precipitates of Yb 4 Al 2 O 9 . Sucking Yb and Al onto the surface resulted in a formation of the first, thin, porous subsurface layer composed from almost pure silicon nitride.…”
Section: Anisotropy and Environmental Effectsmentioning
confidence: 94%
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“…Our earlier studies found out that Yb and Al concentrations correlate with individual layers. [13][14][15][16] The concentration of Al increased in the zone from 30 to 100% of total thickness of the oxidation affected zone compared to the bulk, whereas Yb concentration was lower there with the exception of large precipitates of Yb 4 Al 2 O 9 . Sucking Yb and Al onto the surface resulted in a formation of the first, thin, porous subsurface layer composed from almost pure silicon nitride.…”
Section: Anisotropy and Environmental Effectsmentioning
confidence: 94%
“…Fig. 2 illustrates this case in the terms of [13][14][15][16] engineering strain ε = l/l 0 and true tensile strain, ε t = ln (l/l 0 ), obtained at 1400 • C under the stress of 50 MPa. Both curves are composed of primary stage, short intermediate stage with a minimum strain rate and a prolonged accelerated stage.…”
Section: Creep Behaviormentioning
confidence: 99%
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