Microstructural analysis of GaN films grown on (1 0 0) MgF2 substrate by 4D nanobeam diffraction and energy-dispersive X-ray spectrometry

Westphal, T.; Meyer, Kevin; Flathmann, Christoph; Meyer, Tobias; Schaadt, D. M.; Seibt, M.

doi:10.1016/j.jcrysgro.2022.126972

Journal of Crystal Growth

2023

DOI: 10.1016/j.jcrysgro.2022.126972

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Microstructural analysis of GaN films grown on (1 0 0) MgF2 substrate by 4D nanobeam diffraction and energy-dispersive X-ray spectrometry

T. Westphal

Kevin Meyer

Christoph Flathmann

et al.

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Microstructural analysis of GaN films grown on (1 0 0) MgF2 substrate by 4D nanobeam diffraction and energy-dispersive X-ray spectrometry

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References 31 publications

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