2022
DOI: 10.1038/s41598-022-06259-8
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Microstrip sensor and methodology for the determination of complex anisotropic permittivity using perturbation techniques

Abstract: In this work, a sensor in microstrip technology and a methodology for measuring the real part and the imaginary part of the complex uniaxial permittivity of solid anisotropic samples are presented. The sensor is based on a pair of parallel lines coupled resonators and a cleft arranged in the coupling region which allows to hold the samples under test (SUTs). The proposed methodology relates the change in the even/odd resonance frequency with the real part of the permittivity in the vertical/horizontal directio… Show more

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Cited by 16 publications
(12 citation statements)
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“…One of the most important problems with optimizing the microstrip resonator topology is the computational complexity of the fitness function: modeling the AFC of the resonator in a specified frequency range may take from 5 to 60 s. Resonators used as sensors may have very simply [15,16,45,46,79] or rather sophisticated topology [17,18,80]. For more complex topology, the modelling can take more time.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…One of the most important problems with optimizing the microstrip resonator topology is the computational complexity of the fitness function: modeling the AFC of the resonator in a specified frequency range may take from 5 to 60 s. Resonators used as sensors may have very simply [15,16,45,46,79] or rather sophisticated topology [17,18,80]. For more complex topology, the modelling can take more time.…”
Section: Resultsmentioning
confidence: 99%
“…At the same time, the scope of microstrip resonators is not limited to frequency-selective designs. Microwave sensors designed on their basis are of high interest [14][15][16]. The concept of microwave sensors based on microstrip resonators is based on changes in their frequency response depending on the dielectric permittivity of the samples under test which are considered as an additional dielectric layer [14,[17][18][19][20][21] or are introduced in the cleft of the proposed sensor [16,22].…”
Section: Introductionmentioning
confidence: 99%
“…Step 3 Next, the fabricated sensor loaded with planar samples is tested. It is worth mentioning that the surface roughness and the air gap between the SUT and sensors are the two main challenges in measuring solids with planar structures [11], [12], [13], [14], [15]. The air gap between the SUT and sensors is removed in the experiments by using Styrofoam which is pressed over the sample and the pressure is increased until there is no change in the measured singleended S-parameter, as was proposed in [12].…”
Section: Uniaxial Anisotropy Extraction Processmentioning
confidence: 99%
“…Resonant methods for anisotropy characterization, which are the focus of this paper, have been implemented with different technologies that fall into waveguide [7], [8], [9], [10] or planar circuit [11], [12], [13], [14]. In [8], a dielectric cavity resonator enclosing an anisotropic sample under test (SUT) inside is used.…”
Section: Introductionmentioning
confidence: 99%
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