Microstrip methods for measurement of dielectric properties in High Frequency area

Rovensky, Tibor; Pietriková, Alena; Ruman, Kornel; Kováč, Ondrej

doi:10.1109/isse.2015.7247987

Cited by 5 publications

(6 citation statements)

References 7 publications

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“…Manufacturer provides these values for different type of polymeric substrate Kapton ® HN 100 with very similar properties. Measured values of Kapton ® HN 200 (Table 3) are in correlation with Kapton ® HN 100, where by rising frequency up to 10 GHz dielectric constant is decreasing and dielectric losses are increasing, which confirm correctness of facts mentioned above [19].…”

Section: Pi Substrate Kapton ® Hn 200supporting

confidence: 78%

“…Measuring dielectric properties in wide frequency range is very complicated and complex problem. There are several methods each of these methods have advantages and disadvantages [19,20]. For the purpose of our experiments the split cylinder resonator method was chosen to measure dielectric constant and dielectric losses.…”

Section: Methodsmentioning

confidence: 99%

“…The exact measuring frequency varies depending on specific material since each material has different impact on the resonant frequency of the split cylinder resonator. Dielectric properties are measured by comparison of resonance frequency of empty resonator and resonator with inserted measured material [19,20].…”

Section: Methodsmentioning

confidence: 99%

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Dielectric Properties of Substrates for InkJet Technology in GHz Area

Rovensky

Lukács

Pietriková

2019

Period. Polytech. Elec. Eng. Comp. Sci.

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This paper is focused on investigation of dielectric properties of various substrates for InkJet printing technology. In addition this paper included investigation of dielectric properties' homogeneity. Dielectric constant and loss tangent of polymeric flexible substrates (Polyimide DuPont Kapton HN, PET Mylar A, PEN Teonex Q51) and insulation paper (Nomex 410) were measured in GHz frequency area. Measurements were done by combination of vector network analyzer and split cylinder resonator. This measuring method provides dielectric properties at frequency around 10 GHz, the exact value of frequency may vary depends on specific material and its resonant frequency. Experiments included two types of samples, 6 x 6 cm which is recommended area for measurements of dielectric properties by split cylinder resonator and 12 x 12 cm for measurements of dielectric properties' homogeneity (one sheet contains 9 overlapping measuring areas 6 x 6 cm). All measured values of dielectric constant and dielectric losses were statistically processed and depicted by SigmaPlot software. The paper shows values of dielectric properties at GHz frequency area as they are lacking in datasheets from manufacturers and evaluate homogeneity of measured substrates.

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Section: Pi Substrate Kapton ® Hn 200supporting

confidence: 78%

Section: Methodsmentioning

confidence: 99%

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Dielectric Properties of Substrates for InkJet Technology in GHz Area

Rovensky

Lukács

Pietriková

2019

Period. Polytech. Elec. Eng. Comp. Sci.

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“…The method of microstrip ring resonators was used to provide numerous data points over a wide frequency range (Heinola et al , 2004). Microstrip ring resonators, shown in Figure 1, were designed by self-made software tool (Rovensky et al , 2015) and fabricated by common thick film technology. Ring resonators are tuned to primary resonance frequency at 2 GHz and were measured by probe station to minimalize errors caused by soldering connectors (Figure 2).…”

Section: Measurements Of Dielectric Propertiesmentioning

confidence: 99%

“…Dielectric properties are determined from measured scattering parameters (forward transmission coefficient) which are shown in Figure 2. Resonance frequency and bandwidth at −3 dB are used as input parameters for self-made software tool (Rovensky et al , 2015). Based on input parameters, equations (Heinola et al , 2004) are solved, and dielectric constant and Q factor are calculated.…”

Section: Scattering Parameters and Dielectric Propertiesmentioning

confidence: 99%

Influence of various multilayer LTCC systems on dielectric properties’ stability in GHz frequency range

Rovensky

Pietriková

Vehec

et al. 2016

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Purpose The purpose of this paper is to create multilayer substrate (composite) from various low temperature co-fired ceramic (LTCC) substrates by their mutual combinations and to analyse influence of these multilayer substrates on dielectric properties in GHz frequency range. Design/methodology/approach GreenTape 951, GreenTape 9K7 and Murata LFC were used to create compound multilayer substrates that include three layers: middle layer is from Murata LFC, and both upper and bottom layers are either from GreenTape 951 or GreenTape 9K7. Shrinkage in all x-, y- and z-axes of all substrates including multilayer substrates were analysed, and influence of different shrinkage on dielectric properties was examined by microstrip ring resonators applied on all mentioned of substrates. Findings The middle layer of Murata LFC has significant influence on shrinkage value of composites which has a good repeatability and minimalizes problems with design of multilayer LTCC devices. Impact of middle layer from Murata LFC on dielectric constant is not significant, but on the other hand Q factor (loss tangent) of these composites is increased according to inhomogeneity between single LTCC layers, especially at frequency around 6 GHz. Originality/value The novelty of this work lies in creating multilayers systems from different types of LTCC substrates to find combination with the most suitable physical and dielectric properties for various purposes in GHz range applications.

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