2013
DOI: 10.1007/s10853-013-7469-4
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Microstrain and growth fault structures in electrodeposited nanocrystalline Ni and Ni–Fe alloys

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Cited by 27 publications
(5 citation statements)
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“…This growth observed by XRD concerned various crystallographic planes which did not affect the peak diffraction positions. Giallonardo et al 41 showed that the growth faults may be due to stacking faults which are not caused by deformation processes. Moreover, it is believed that these stacking faults could be related to the heterogeneity concluded from the TEM particle size distribution and H 2 -TPR profiles for D and CI samples.…”
Section: Resultsmentioning
confidence: 99%
“…This growth observed by XRD concerned various crystallographic planes which did not affect the peak diffraction positions. Giallonardo et al 41 showed that the growth faults may be due to stacking faults which are not caused by deformation processes. Moreover, it is believed that these stacking faults could be related to the heterogeneity concluded from the TEM particle size distribution and H 2 -TPR profiles for D and CI samples.…”
Section: Resultsmentioning
confidence: 99%
“…The obtained micro-strain values for the 0.25 at%Zr alloy were about 3.05 × 10 −3 , which value increased to 4.45 × 10 −3 with increasing Zr concentration. The increasing of lattice micro strain with increasing of Zrcontent due to the reduction of crystallite size (D) with increase in the dislocation density (δ) [24].…”
Section: Resultsmentioning
confidence: 99%
“…The shift toward shorter wavelengths shows the rise in the optical band gap. [24][25][26][27][28][29][30][31][32].…”
Section: Thermal Properties Of Fe 1-x -Zr X Alloymentioning
confidence: 99%
“…In combination with grain size evolution, the main reason for the decrease of r.m.s. microstrain would be associated to the grain coalescence and coarsening [ 27 29 ].…”
Section: Resultsmentioning
confidence: 99%